InTech, 2011, 280 pages, ISBN: 9533079677 9789533079677
This book consists of selected chapters on the recent applications of x-ray spectroscopy that are of great interest to the scientists and engineers working in the fields of material science, physics, chemistry, astrophysics, astrochemistry, instrumentation, and techniques of x-ray based characterization. The book covers some basic principles of satellite x-rays as characterization tools for chemical properties and the physics of detectors and x-ray spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam analysis, particle induced XRF, and matrix effects are discussed. The characterization of thin films and ceramic materials using x-rays is also covered.
The chapters have been grouped into two major sections based upon the techniques and applications.
Contents
XRF Processes and Techniques
X-Ray Spectroscopy Tools for the Characterization of Nanoparticles
A Practical Application of X-Ray Spectroscopy in Ti-AI-N and Cr-AI-N Thin Films
High Resolution X-Ray Spectroscopy with Compound Semiconductor Detectors and Digital Pulse Processing Systems
Analysis of the К Satellite Lines in X-Ray Emission Spectra
Application of Wavelength Dispersive X-Ray Spectroscopy in X-Ray Trace Element Analytical Techniques
Characterization and Analytical Applications of X-Rays
The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science
Chemical Quantification of Mo-S, W-Si and Ti-V by Energy Dispersive X-Ray Spectroscopy
Quantification in X-Ray Fluorescence Spectrometry
The Interaction of High Brightness X-Rays with Clusters or Bio-Molecules
Employing Soft X-Rays in Experimental Astrochemistry
X-Ray Analysis on Ceramic Materials Deposited by Sputtering and Reactive Sputtering for Sensing Applications
Application of Stopped-Flow and Time-Resolved X-Ray Absorption Spectroscopy to the Study of Metalloproteins Molecular Mechanisms
Nanoscale Chemical Analysis in Various Interfaces with Energy Dispersive X-Ray Spectroscopy and Transmission Electron Microscop