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Test and diagnosis for small-delay defects

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This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

Author(s): Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty (auth.)
Edition: 1
Publisher: Springer-Verlag New York
Year: 2012

Language: English
Pages: 212
City: New York
Tags: Circuits and Systems; Performance and Reliability; Nanotechnology and Microengineering

Front Matter....Pages i-xviii
Introduction to VLSI Testing....Pages 1-19
Delay Test and Small-Delay Defects....Pages 21-36
Long Path-Based Hybrid Method....Pages 37-60
Process Variations- and Crosstalk-Aware Pattern Selection....Pages 61-82
Power Supply Noise- and Crosstalk-Aware Hybrid Method....Pages 83-104
SDD-Based Hybrid Method....Pages 105-118
Maximizing Crosstalk Effect on Critical Paths....Pages 119-137
Maximizing Power Supply Noise on Critical Paths....Pages 139-152
Faster-Than-At-Speed Test....Pages 153-173
Introduction to Diagnosis....Pages 175-192
Diagnosing Noise-Induced SDDs by Using Dynamic SDF....Pages 193-212