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System-on-Chip Test Architectures: Nanometer Design for Testability (Systems on Silicon)

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This book is the more system oriented variation and addition to VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) published earlier by L.T. Wang.You get the most complete and up-to-date summary of DfT methodes and techniques. I am using the book at work and for teaching students at the University. For teaching you are granted access to training material and ATPG software to use with students for free.

Author(s): Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
Series: Systems on Silicon
Publisher: Morgan Kaufmann
Year: 2007

Language: English
Pages: 893