This reference text introduces advanced topics in the field of reliability engineering, introduces statistical modeling techniques, and probabilistic methods for diverse applications.
It comprehensively covers important topics including consecutive-type reliability systems, coherent structures, multi-scale statistical modeling, the performance of reliability structures, big data analytics, prognostics, and health management. It covers real-life applications including optimization of telecommunication networks, complex infrared detecting systems, oil pipeline systems, and vacuum systems in accelerators or spacecraft relay stations. The text will serve as an ideal reference book for graduate students and academic researchers in the fields of industrial engineering, manufacturing science, mathematics, and statistics.
Author(s): Ioannis S. Trianntafyllou, Mangey Ram
Series: Advanced Research in Reliability and System Assurance Engineering
Publisher: CRC Press
Year: 2022
Language: English
Pages: 245
City: Boca Raton
Cover
Half Title
Series
Title
Copyright
Contents
Preface
Editor Biographies
List of Contributors
Chapter 1 Recent Extensions of Signature Representations
Chapter 2 Review of Some Shock Models in Reliability Systems
Chapter 3 Goodness of Fit Exponentiality Test against Light and Heavy Tail Alternatives
Chapter 4 Some Topics on Optimal Redundancy Allocation Problems in Coherent Systems
Chapter 5 Unsupervised Learning for Large Scale Data: The ATHLOS Project
Chapter 6 Monitoring Process Location and Dispersion Using the Double Moving Average Control Chart
Chapter 7 On the Application of Fractal Interpolation Functions within the Reliability Engineering Framework
Chapter 8 The EWMA Control Chart for Lifetime Monitoring with Failure censoring Reliability Tests and Replacement
Chapter 9 On the Lifetime of Reliability Systems
Chapter 10 A Technique for Identifying Groups of Fractional Factorial Designs with Similar Properties
Chapter 11 Structured Matrix Factorization Approach for Image Deblurring
Chapter 12 Reconfigurable Intelligent Surfaces for Exploitation of the Randomness of Wireless Environments
Chapter 13 Degradation of Reliability of Digital Electronic Equipment Over Time and Redundant Hardware-based Solutions
Index