This book combines the experience and achievements in engineering practice of the China Academy of Space Technology, Xi’an, with a focus on the field of high-power multipactor over recent decades. It introduces the main concepts, theories, methods and latest technologies of multipactor simulation, at both the theoretical level and as a process of engineering, while providing a comprehensive introduction to the outstanding progress made in the research technology of multipactor numerical simulation in China. At the same time, a three-dimensional numerical simulation method of multipactor for typical high-power microwave components of spacecraft is introduced.
This book is an essential volume for engineers in the field of high-power microwave technology. It can also be used as a reference for researchers in related fields, or as a teaching reference book for graduate students majoring in Astronautics at colleges and universities.
Author(s): Wanzhao Cui, Yun Li, Hongtai Zhang, Jing Yang
Series: Space Science, Technology and Application Series
Publisher: CRC Press
Year: 2021
Language: English
Pages: 236
City: Boca Raton
Cover
Half Title
Series Page
Title Page
Copyright Page
Table of Contents
Foreword I
Foreword II
Foreword III
Preface
CHAPTER 1 Introduction
1.1 OVERVIEW
1.1.1 Vacuum Conditions
1.1.2 The Existence of Free Electrons
1.1.3 Maximum Secondary Electron Yield (SEY) of the Material Is Greater Than 1
1.1.4 Transition Time of Secondary Electrons Is an Odd Multiple of One Half-Cycle of a Microwave Signal
1.2 RESEARCH BACKGROUND OF SPACECRAFT MULTIPACTOR EFFECT
1.3 RESEARCH HISTORY OF NUMERICAL SIMULATION METHODS OF MULTIPACTOR FOR SPACE APPLICATION
1.4 RELATED RESEARCH INSTITUTIONS AND RESEARCH PROGRESS IN CHINA
1.5 SUMMARY
REFERENCES
CHAPTER 2 Basic Theory and Measurement Method of Secondary Electron Emission in Multipactor
2.1 OVERVIEW
2.2 BASIC THEORY OF SEE
2.2.1 Principle of SEE
2.2.1.1 Electron Internal Collision
2.2.1.2 Electron Emission
2.2.1.3 Influence of Surface Barrier
2.3 SIMULATION OF SEE
2.3.1 Theoretical Formula
2.3.1.1 Furman Model
2.3.1.2 Everhart Model
2.3.1.3 Semi-Physical Model
2.3.2 Monte Carlo Simulation
2.3.2.1 Elastic Scattering
2.3.2.2 Inelastic Scattering
2.3.2.3 Simulation Process of Electron Scattering
2.4 MEASUREMENT OF SEY
2.4.1 Measurement of SEY of Metal Materials
2.4.2 Measurement of SEY of Dielectric and Semiconductor Mater ials
2.4.3 SES Measurement
2.5 FACTORS AFFECTING SEY
2.5.1 Surface Adsorption and Contaminants on the Surface
2.5.2 Surface Topography
2.6 THE SEY AND SES OF SOME COMMON METAL MATERIALS
2.7 SUMMARY
REFERENCES
CHAPTER 3 Electromagnetic Particle-in-Cell Method
3.1 OVERVIEW
3.2 DEVELOPMENT AND APPLICATION OF EM-PIC METHOD
3.3 PROCEDURE OF THE EM-PIC METHOD
3.4 FDTD METHOD
3.4.1 Maxwell Equations and Differential Difference Scheme
3.4.2 Spatial Discrete and Time-Discrete Format
3.4.3 Difference Scheme
3.5 PARTICLE MODEL AND EQUATION OF MOTION
3.5.1 Macroparticle Model
3.5.2 Equations of Motion of Particles
3.6 AN ALGORITHM OF BEAM-WAVE INTERACTION
3.6.1 Charged Particle Motion in Electromagnetic Fields
3.6.2 Effect of Charged Particle Motion on Electromagnetic Field
3.6.2.1 Effect of Particle Propulsion on Charge Density
3.6.2.2 Effect of Particle Propulsion on Current Density
3.7 PARTICLE BOUNDARY CONDITIONS
3.7.1 General Particle Boundary Conditions
3.7.2 Particle Emission Boundary Conditions
3.7.2.1 Thermal Electron Emission Boundary Conditions
3.7.2.2 Boundary Conditions of Field Electron Emission
3.7.2.3 Boundary Conditions of Thermal Field Emission
3.7.2.4 Space Charge Limited Emission
3.8 FIELD BOUNDARY CONDITION
3.8.1 Conventional Field Boundary Condition
3.8.1.1 Conductor and Dielectric Boundary Condition
3.8.1.2 Symmetry Boundary Condition
3.8.2 Excitation Source Boundary Condition
3.8.2.1 Time Harmonic Field Source
3.8.2.2 Pulse Source
3.8.2.3 Waveguide Excitation Source
3.8.3 Electromagnetic Wave Absorption Boundary Condition
3.9 STABILITY CONDITION
3.10 SUMMARY
REFERENCES
CHAPTER 4 EM PIC Simulation of Multipactor
4.1 INTRODUCTION
4.2 EM PIC SIMULATION METHOD
4.3 EM PIC SIMULATION METHOD BASED ON NON-UNIFORM MESHING
4.3.1 Mesh Coordinates Converted to Actual Coordinates
4.3.2 Actual Coordinates Converted to Mesh Coordinates
4.4 BOUNDARY CONDITIONS IN MULTIPACTOR SIMULATION
4.4.1 Conductor Boundary
4.4.2 Open Boundary
4.4.3 Symmetry Boundary
4.4.4 Periodic Boundary
4.5 EFFECT OF SEE ON MULTIPACTOR SIMULATION
4.5.1 Basic Theory
4.5.2 Numerical SEE Model
4.5.2.1 Emission Angle
4.5.2.2 Emission Energy
4.5.3 Three Types of SEs
4.5.3.1 Basic Assumptions
4.5.3.2 Elastic Electron Model
4.5.3.3 Scattering Electron Model
4.5.3.4 True Secondary Electrons
4.5.3.5 Emission Probability
4.5.3.6 Correction of TSE Emission Probability
4.5.3.7 Relationship with the Incident Angle
4.5.3.8 Secondary Electron Emission Spectrum
4.5.4 SEE Calculation in Multipactor Simulation
4.6 SIMULATION OF MULTIPACTOR IN RECTANGULAR WAVEGUIDES
4.7 SIMULATION AND ANALYSIS OF MULTIPACTOR IN AN IMPEDANCE TRANSFORMER
4.7.1 Geometric Modelling
4.7.2 Meshing
4.7.3 Simulation Results
4.8 SIMULATION AND ANALYSIS OF MULTIPACTOR IN AN RIDGE-WAVEGUIDE FILTER
4.8.1 Geometric Modelling
4.8.2 Meshing
4.8.3 Simulation Results
4.9 SIMULATION AND ANALYSIS OF MULTIPACTOR IN MICROWAVE SWITCH
4.10 SUMMARY
REFERENCES
CHAPTER 5 Multipactor Analysis in Multicarrier Systems
5.1 INTRODUCTION
5.2 MULTICARRIER SIGNALS
5.3 TWENTY GAP-CROSSING RULE (TGR)
5.4 LONG-TERM MULTICARRIER MULTIPACTOR
REFERENCES
CHAPTER 6 PIC Simulation of Collector for TWT
6.1 INTRODUCTION
6.2 PRINCIPLE OF TRAVELING WAVE TUBE
6.3 OPERATING PRINCIPLE OF THE COLLECTOR OF TRAVELING WAVE TUBE
6.4 NUMERICAL ALGORITHM FOR COLLECTOR
6.4.1 The Basic Principle of the Algorithm
6.4.1.1 Maxwell Equation
6.4.1.2 Equation of Motion
6.4.1.3 Current Continuity Equation
6.4.2 Secondary Electrons in the Collector
6.5 SIMULATED EXAMPLES OF COLLECTOR
6.5.1 The Efficiency of the Collector
6.5.2 Simulated Example
6.6 SUMMARY
REFERENCES
