Sic Materials and Devices, Volume 2 (Selected Topics in Electronics and Systems)

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This second of two volumes reviews four important additional areas: the growth of SiC substrates; the deep defects in different SiC polytypes, which after many years of research still define the properties of bulk SiC and the performance and reliability of SiC devices; recent work on SiC JFETs; and the complex and controversial issues important for bipolar devices.

Author(s): Michael Shur
Year: 2007

Language: English
Pages: 140