Starting from basic principles, this book describes the rapidly growing field of modern semiconductor detectors used for energy and position measurement radiation. The author, whose own contributions to these developments have been significant, explains the working principles of semiconductor radiation detectors in an intuitive way. Broad coverage is also given to electronic signal readout and to the subject of radiation damage.
Author(s): Gerhard Lutz
Publisher: Springer
Year: 2007
Language: English
Pages: 364
Contents......Page 7
1. Introduction......Page 12
Part I: Semiconductor Physics......Page 15
2.1 Crystal Structure......Page 16
2.2 Energy Bands......Page 17
2.3 Intrinsic Semiconductors......Page 20
2.4 Extrinsic Semiconductors......Page 23
2.5 Carrier Transport in Semiconductors......Page 25
2.6 Carrier Generation and Recombination in Semiconductors......Page 30
2.7 Simultaneous Treatment of Carrier Generation and Transport......Page 43
2.8 Summary and Discussion......Page 46
3.1 The p–n Diode Junction......Page 48
3.2 Metal–Semiconductor Contact......Page 65
3.3 Metal–Insulator–Semiconductor Structure......Page 68
3.4 The n[sup(+)]-n or p[sup(+)]-p Structures......Page 81
3.5 Summary and Discussion......Page 82
Part II: Semiconductor Detectors......Page 85
4.1 The Properties of Intrinsic Semiconductor Materials......Page 86
4.2 Properties of Extrinsic Semiconductor Materials......Page 90
4.3 Insulators and Metals......Page 95
4.4 Choice of Detector Material......Page 98
5.1 Unbiased Diode......Page 101
5.2 Reverse-Biased Diode......Page 106
5.3 Summary......Page 113
6.1 Resistive Charge Division......Page 115
6.2 Diode Strip Detectors......Page 116
6.3 Strip Detectors with Double-Sided Readout......Page 122
6.4 Strip Detectors with Integrated Capacitive Readout Coupling......Page 126
6.5 Drift Detectors......Page 131
6.6 Charge Coupled Devices as Detectors......Page 143
6.7 Summary......Page 157
7.1 Operating Principles of Transistors......Page 159
7.2 Noise Sources......Page 186
7.3 The Measurement of Charge......Page 196
7.4 Basic Electronic Circuits......Page 201
7.5 Integrated Circuit Technologies......Page 209
7.6 Integrated Circuits for Strip Detectors......Page 213
7.7 Integrated Circuits for Pixel Detectors......Page 216
7.8 Noise in Strip Detectors – Front-End Systems......Page 217
7.9 Summary......Page 231
8.1 Hybrid Systems of Detectors and Their Electronics......Page 234
8.2 Detector-Technology-Compatible Electronics......Page 238
9.1 Avalanche Diode......Page 244
9.2 Depleted Field Effect Transistor Structure......Page 248
9.3 DEPFET Pixel Detectors......Page 259
10.1 Production of Detector Substrates......Page 264
10.2 Processing Sequence in Planar Technology......Page 265
10.3 Technology Simulation......Page 271
11.1 Electrical Breakdown and Protection......Page 272
11.2 Radiation Damage in Semiconductors......Page 280
11.3 Radiation Damage in the Surface Region......Page 307
11.4 Radiation Damage in Detectors......Page 309
11.5 Radiation Damage in Electronics......Page 313
11.6 Radiation Hardening Techniques......Page 315
11.7 Summary......Page 316
12.1 Mathematical Formulation......Page 318
12.2 Numerical Solution of Stationary Situations......Page 324
12.3 Simulation of Time-Dependent Situations......Page 335
Part III: Reference Material......Page 337
Appendix A: Frequently Used Symbols......Page 338
Appendix B: Physical Constants......Page 341
Books and Reviews......Page 342
Articles......Page 343
C......Page 349
F......Page 350
N......Page 351
S......Page 352
Z......Page 353
