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Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis

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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.

Author(s): Nobuo Tanaka
Publisher: Imperial College Press
Year: 2014

Language: English
Pages: 400
Tags: Специальные дисциплины;Наноматериалы и нанотехнологии;Методы исследования наноматериалов;