Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
Author(s): Ernst Meyer; Roland Bennewitz; Hans J. Hug
Publisher: Springer Nature
Year: 2021
Language: English
Pages: 322
Preface
Contents
Abbreviations
1 Introduction to Scanning Probe Microscopy
1.1 Overview
1.2 Basic Concepts
1.2.1 Local Probes
1.2.2 Scanning and Control
1.2.3 Vibrational Isolation
1.2.4 Computer Control and Image Processing
2 Introduction to Scanning Tunneling Microscopy
2.1 Tunneling: A Quantum-Mechanical Effect
2.1.1 Tersoff–Hamann Model
2.2 Instrumental Aspects
2.2.1 Tunneling Tips
2.2.2 Implementation in Different Environments
2.2.3 Operation Modes
2.2.4 Manipulation Modes
2.3 Resolution Limits
2.3.1 Imaging of Semiconductors
2.3.2 Imaging of Metals
2.3.3 Imaging of Layered Materials
2.3.4 Imaging of Molecules
2.3.5 Imaging of Insulators
2.3.6 Theoretical Estimates of Resolution Limits
2.4 Observation of Confined Electrons
2.4.1 Scattering of Surface State Electrons at Steps
2.4.2 Scattering of Surface State Electrons at Point Defects
2.4.3 Electron Confinement to Nanoscale Boxes
2.4.4 Summary of Dispersion Relations for Noble-Metal (111) Surfaces
2.4.5 Electron Confinement in Interfacial States of Molecular Layers on Metals
2.5 Spin-Polarized Tunneling
2.6 Observation of the Kondo Effect and Quantum Mirage
2.7 Observation of Majorana Bound States
2.8 Single-Molecule Inelastic Tunneling Probe
2.9 Scanning Tunneling Hydrogen Microscopy
3 Force Microscopy
3.1 Concept and Instrumental Aspects
3.1.1 Deflection Sensors: Techniques to Measure Small Cantilever Deflections
3.1.2 Spring Constants of Rectangular Cantilevers
3.1.3 Cantilever and Tip Preparation
3.1.4 Implementations of Force Microscopy
3.2 Relevant Forces
3.2.1 Short-Range Forces
3.2.2 Van der Waals Forces
3.2.3 Electrostatic Forces
3.2.4 Magnetic Forces
3.2.5 Capillary Forces
3.2.6 Forces in Liquids
3.3 Operation Modes in Force Microscopy
3.4 Contact Force Microscopy
3.4.1 Topographic Imaging
3.4.2 Lateral Resolution and Contact Area
3.4.3 Friction Force Microscopy
3.4.4 Atomic Friction Processes
3.4.5 Lateral Contact Stiffness
3.4.6 Velocity Dependence of Atomic Friction
3.4.7 Temperature Dependence of Atomic Friction
3.4.8 Molecular Friction
3.5 Dynamic Force Microscopy
3.5.1 Modelling Dynamic Force Microscopy
3.5.2 High-Resolution Imaging
3.5.3 Spectroscopic Measurements
3.5.4 Kelvin Probe Microscopy
3.5.5 Dissipation Force Microscopy
3.5.6 Non-contact Friction
3.6 Tapping Mode Force Microscopy
3.6.1 Principles of Operation
3.6.2 Phase Imaging
3.6.3 Non-linear Effects
3.7 Further Modes of Force Microscopy
3.8 Pulsed Force Mode
3.9 Force Resolution and Thermal Noise
3.10 High-Speed AFM
3.11 Multifrequency AFM
4 Magnetic Force Microscopy
4.1 Principles of Magnetic Force Microscopy
4.1.1 Early Work
4.1.2 Tip-Sample Distance Control
4.1.3 Magnetic Force Microscopy Tips and Cantilevers
4.2 MFM Contrast Formation
4.2.1 Negligible Perturbation
4.2.2 Reversible Perturbation
4.2.3 Irreversible Perturbation
4.2.4 Dissipation Contrast
4.3 Magnetic Stray Fields
4.3.1 General Concepts
4.3.2 Field of Thin Film Sample
4.3.3 Effects of the Domain Wall on the Field
4.3.4 Fields from Roughness and Thickness Variations
4.4 Quantitative Magnetic Force Microscopy
4.4.1 In-Vacuum Operation for Improved Sensitivity
4.4.2 Tip-Sample Distance Control Suitable for Vacuum
4.4.3 Separation of Forces
4.4.4 MFM Transfer Function Theory
4.4.5 Calibration of the MFM Tip
4.4.6 Applications of Quantitative MFM
4.5 Other SPM Methods for Mapping Nanoscale Magnetism
4.5.1 SPM Methods Mapping the Magnetic Field
4.5.2 SPM Methods Mapping Magnetism at the Atomic Scale
5 Other Members of the SPM Family
5.1 Scanning Near-Field Optical Microscopy (SNOM)
5.2 Scanning Near-Field Acoustic Microscopy (SNAM)
5.3 Scanning Ion Conductance Microscopy (SICM)
5.4 Photoemission Microscopy with Scanning Aperture (PEMSA)
5.5 STM with Inverse Photoemission (STMiP)
5.6 Laser Scanning Tunneling Microscopy (LSTM)
5.7 Electrochemical Scanning Tunneling Microscopy (ECSTM)
5.8 Scanning Thermal Microscopy (SThM)
5.9 Scanning Noise Microscopy (SNM)
5.10 Scanning Tunneling Potentiometry (SPotM)
5.11 Scanning Capacitance Microscopy (SCM)
5.12 Scanning Spreading Resistance Microscopy (SSRM)
5.13 Scanning Tunneling Atom Probe (STAP)
5.14 Tip Enhanced Raman Scattering (TERS)
5.15 Photo Induced Force Microscopy (PIFM)
6 Artifacts in SPM
6.1 Introduction to Artifacts in SPM
6.2 Tip Artifact: Convolution with Tip Shape
6.3 Influence of Local Inhomogenieties on Topography
6.3.1 STM Topography
6.3.2 SFM Topography
6.4 Influence of Topography on Local Measurements
6.4.1 Influence of Topography on STM-Induced Photon Emission
6.4.2 Influence of Topography on Lateral Force Measurements
6.5 Instrumental Artifacts
6.5.1 Piezoelectric Hysteresis, Creep of Scanners, Nonlinearities and Calibration Errors
6.5.2 Tip Crashes, Feedback Oscillations, Noise, Thermal Drift
6.5.3 Interference Patterns with Beam Deflection SFM
7 Future Aspects of SPM
7.1 Parallel Operation of SFM Cantilever Arrays
7.2 Novel Sensors Based on Cantilevers
7.2.1 Gravimetric Sensors
7.2.2 Calorimeter Sensors
7.2.3 Surface Stress Sensors
7.2.4 Cantilever Array Sensors
7.3 Molecular Electronics
7.4 Quantum Computing and Quantum Matter
7.5 Laboratory on a Tip
7.6 Local Modification Experiments
Bibliography
Index
Index
