Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. Key Features: •Serves the rapidly developing field of nanoscale characterization of functional materials properties •Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors •Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations •Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization
Author(s): Peter Maksymovych (auth.), Sergei V. Kalinin, Alexei Gruverman (eds.)
Edition: 1
Publisher: Springer-Verlag New York
Year: 2011
Language: English
Pages: 555
Tags: Characterization and Evaluation of Materials
Front Matter....Pages i-xviii
Front Matter....Pages 1-1
Excitation and Mechanisms of Single Molecule Reactions in Scanning Tunneling Microscopy....Pages 3-37
High-Resolution Architecture and Structural Dynamics of Microbial and Cellular Systems: Insights from in Vitro Atomic Force Microscopy....Pages 39-68
Front Matter....Pages 69-69
Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications....Pages 71-94
Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy Methods....Pages 95-124
Multi-Frequency Atomic Force Microscopy....Pages 125-151
Dynamic Nanomechanical Characterization Using Multiple-Frequency Method....Pages 153-178
Front Matter....Pages 179-179
Toward Nanoscale Chemical Imaging: The Intersection of Scanning Probe Microscopy and Mass Spectrometry....Pages 181-198
Dynamic SPM Methods for Local Analysis of Thermo-Mechanical Properties....Pages 199-229
Front Matter....Pages 231-231
Advancing Characterization of Materials with Atomic Force Microscopy-Based Electric Techniques....Pages 233-300
Quantitative Piezoresponse Force Microscopy: Calibrated Experiments, Analytical Theory and Finite Element Modeling....Pages 301-328
High-Speed Piezo Force Microscopy: Novel Observations of Ferroelectric Domain Poling, Nucleation, and Growth....Pages 329-344
Polar Structures in Relaxors by Piezoresponse Force Microscopy....Pages 345-383
Symmetries in Piezoresponse Force Microscopy....Pages 385-402
Front Matter....Pages 403-403
New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy....Pages 405-431
Scanning Ion Conductance Microscopy....Pages 433-460
Combined Voltage-Clamp and Atomic Force Microscope for the Study of Membrane Electromechanics....Pages 461-489
Dynamic and Spectroscopic Modes and Multivariate Data Analysis in Piezoresponse Force Microscopy....Pages 491-528
Polarization Behavior in Thin Film Ferroelectric Capacitors at the Nanoscale....Pages 529-540
Back Matter....Pages 541-555
