This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber
Author(s): Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer (auth.), Bharat Bhushan (eds.)
Series: NanoScience and Technology
Edition: 1
Publisher: Springer-Verlag Berlin Heidelberg
Year: 2010
Language: English
Pages: 956
Tags: Nanotechnology; Condensed Matter Physics; Engineering, general
Front Matter....Pages i-xxx
Front Matter....Pages 1-1
Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids....Pages 3-21
Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy....Pages 23-56
Polarization-Sensitive Tip-Enhanced Raman Scattering....Pages 57-88
Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes....Pages 89-128
Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics....Pages 129-168
Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity....Pages 169-197
Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter....Pages 199-223
Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope....Pages 225-257
Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy....Pages 259-321
Front Matter....Pages 325-325
Simultaneous Topography and Recognition Imaging....Pages 325-362
Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM....Pages 363-393
Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules....Pages 395-423
Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices....Pages 425-486
Quantized Mechanics of Nanotubes and Bundles....Pages 487-506
Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials....Pages 507-570
Mechanical Properties of One-Dimensional Nanostructures....Pages 571-611
Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale....Pages 613-646
Controlling Wear on Nanoscale....Pages 647-686
Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping....Pages 687-720
Front Matter....Pages 723-723
Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture....Pages 723-756
Front Matter....Pages 723-723
Near-Field Optical Litography....Pages 757-793
A New AFM-Based Lithography Method: Thermochemical Nanolithography....Pages 795-811
Scanning Probe Alloying Nanolithography....Pages 813-832
Structuring the Surface of Crystallizable Polymers with an AFM Tip....Pages 833-866
Application of Contact Mode AFM to Manufacturing Processes....Pages 867-914
Scanning Probe Microscopy as a Tool Applied to Agriculture....Pages 915-944
Back Matter....Pages 945-956
