Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.
Author(s): Dror Sarid
Series: Oxford Series in Optical and Imaging Sciences
Edition: Rev Sub
Publisher: Oxford University Press, USA
Year: 1994
Language: English
Pages: 284
PREFACE TO THE REVISED EDITION......Page 8
PREFACE......Page 10
Contents......Page 16
1.1. Introduction......Page 22
1.2. Stress and Strain......Page 23
1.3. Moments......Page 25
1.4. Spring Constant......Page 26
1.5. The Rayleigh Solution to a Vibrating Lever......Page 28
1.6. The Classical Solution to a Vibrating Lever......Page 30
1.7. Normal Modes......Page 31
1.8. Lumped Systems......Page 33
1.9. Examples......Page 34
1.10. Summary......Page 38
2.2. Bimorph Driver......Page 40
2.3. Effective Spring Constant......Page 42
2.4. Bimorph-Driven Lever......Page 43
2.5. Sample-Driven Lever......Page 53
2.6. Tip-Driven Lever......Page 56
2.7. Summary......Page 58
3.2. General Discussion of Noise......Page 60
3.3. Shot Noise......Page 62
3.5. Laser Intensity Noise......Page 63
3.6. Laser Phase Noise......Page 64
3.7. Thermally Induced Lever Noise......Page 67
3.9. Lever Noise-Limited SNR......Page 70
3.10. Experimental Characterization of Noise......Page 71
3.11. Summary......Page 74
4.2. Theory......Page 76
4.3. Perpendicular Arrangement......Page 78
4.8. Summary......Page 85
5.1. Introduction......Page 86
5.2. Theory......Page 87
5.3. Noise Considerations......Page 89
5.4. Performance of Systems......Page 90
5.5. Summary......Page 94
6.1. Introduction......Page 96
6.2. Theory......Page 97
6.3. Noise Considerations......Page 102
6.4. System Performance......Page 105
6.5. Summary......Page 110
7.1. Introduction......Page 112
7.2. Theory......Page 113
7.3. Noise Considerations......Page 116
7.4. Performance......Page 117
7.5. Summary......Page 120
8.1. Introduction......Page 122
8.2. Theory......Page 123
8.3. Noise Considerations......Page 126
8.4. Performance......Page 128
8.5. Summary......Page 129
9.2. Theory......Page 130
9.3. Noise Considerations......Page 134
9.4. Performance......Page 137
9.5. Summary......Page 138
10.1. Introduction......Page 140
10.2. Theory......Page 141
10.3. Noise Considerations......Page 143
10.4. Performance......Page 146
10.5. Summary......Page 149
11.2. Basic Concepts......Page 150
11.3. Examples......Page 152
11.4. Principles of Operation......Page 158
11.5. Noise Considerations......Page 166
11.6. Applications......Page 167
11.7. Performance......Page 169
11.8. Summary......Page 172
12.2. Basic Concepts......Page 174
12.3. Examples......Page 177
12.4. Principles of Operation......Page 188
12.5. Noise Considerations......Page 194
12.7. Performance......Page 195
12.8. Summary......Page 201
13.1. Introduction......Page 202
13.2. Intermolecular Microscopic Interactions......Page 203
13.3. Intermolecular Macroscopic Interactions......Page 210
13.4. Lever-Tip-Sample Contact Interactions......Page 218
13.5. Lever-Tip-Sample Noncontact Interactions......Page 231
13.6. Experimental Results for the Contact Mode......Page 239
References......Page 254
L......Page 282
S......Page 283
Y......Page 284
