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Reliability Physics and Engineering: Time-To-Failure Modeling

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Author(s): J.W. McPherson (auth.)
Edition: 1st Edition.
Publisher: Springer US
Year: 2010

Language: English
Pages: 386
Tags: Quality Control, Reliability, Safety and Risk; Electronics and Microelectronics, Instrumentation; Mechanical Engineering

Front Matter....Pages i-xiii
Introduction....Pages 1-3
Materials and Device Degradation....Pages 5-28
From Material/Device Degradation to Time-To-Failure....Pages 29-35
Time-To-Failure Modeling....Pages 37-50
Gaussian Statistics — An Overview....Pages 51-61
Time-To-Failure Statistics....Pages 63-77
Failure Rate Modeling....Pages 79-93
Accelerated Degradation....Pages 95-107
Acceleration Factor Modeling....Pages 109-119
Ramp-to-Failure Testing....Pages 121-136
Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits....Pages 137-197
Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering....Pages 199-272
Conversion of Dynamical Stresses into Effective Static Values....Pages 273-298
Increasing the Reliability of Device/Product Designs....Pages 299-310
Erratum to: Materials and Device Degradation....Pages 310-311
Back Matter....Pages 311-318