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PIXE: A Novel Technique for Elemental Analysis

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The first comprehensive review of the basic physics, and modern applications, of proton-induced x-ray emission. The physics section and the applications section are relatively independent, making for easy reference. The authors discuss instrument design, and how to handle specimens. They then survey the wide range of applications to which proton-induced x-ray emission has been put. Illustrated.

Author(s): Sven A.E. Johansson and John L. Campbell
Edition: 1st Edition
Publisher: John Wiley and Sons Ltd.
Year: 1988

Language: English
Pages: 361