Photoelectron Spectroscopy: Bulk and Surface Electronic Structures

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Photoelectron spectroscopy is now becoming more and more required to investigate electronic structures of various solid materials in the bulk, on surfaces as well as at buried interfaces. The energy resolution was much improved in the last decade down to 1 meV in the low photon energy region. Now this technique is available from a few eV up to 10 keV by use of lasers, electron cyclotron resonance lamps in addition to synchrotron radiation and X-ray tubes. High resolution angle resolved photoelectron spectroscopy (ARPES) is now widely applied to band mapping of materials. It attracts a wide attention from both fundamental science and material engineering. Studies of the dynamics of excited states are feasible by time of flight spectroscopy with fully utilizing the pulse structures of synchrotron radiation as well as lasers including the free electron lasers (FEL). Spin resolved studies also made dramatic progress by using higher efficiency spin detectors and two dimensional spin detectors. Polarization dependent measurements in the whole photon energy spectrum of the spectra provide useful information on the symmetry of orbitals. The book deals with the fundamental concepts and approaches for the application of this technique to materials studies. Complementary techniques such as inverse photoemission, photoelectron diffraction, photon spectroscopy including infrared and X-ray and scanning tunneling spectroscopy are presented. This book provides not only a wide scope of photoelectron spectroscopy of solids but also extends our understanding of electronic structures beyond photoelectron spectroscopy.

Author(s): Shigemasa Suga, Akira Sekiyama (auth.)
Series: Springer Series in Optical Sciences 176
Edition: 1
Publisher: Springer-Verlag Berlin Heidelberg
Year: 2014

Language: English
Pages: 378
Tags: Optics, Optoelectronics, Plasmonics and Optical Devices;Optics and Electrodynamics;Surface and Interface Science, Thin Films;Quantum Optics;Physical Chemistry;Characterization and Evaluation of Materials

Front Matter....Pages i-xviii
Introduction....Pages 1-6
Theoretical Background....Pages 7-31
Instrumentation and Methodology....Pages 33-89
Bulk and Surface Sensitivity of Photoelectron Spectroscopy....Pages 91-98
Examples of Angle Integrated Photoelectron Spectroscopy....Pages 99-115
Angle Resolved Photoelectron Spectroscopy in the hν Region of ~15 to 200 eV....Pages 117-153
High Resolution Soft X-ray Angle-Integrated and -Resolved Photoelectron Spectroscopy of Correlated Electron Systems....Pages 155-217
Hard X-ray Photoelectron Spectroscopy....Pages 219-256
Very Low Photon Energy Photoelectron Spectroscopy....Pages 257-278
Inverse Photoemission....Pages 279-293
Magnetic Dichroism and Spin Polarization in Photoelectron Spectroscopy....Pages 295-329
Photoelectron Diffraction and Photoelectron Holography....Pages 331-338
Complementary Techniques for Studying Bulk Electronic States....Pages 339-357
Surface Spectroscopy by Scanning Tunneling Microscope....Pages 359-366
Outlook....Pages 367-368
Back Matter....Pages 369-378