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Numerical Field Calculation for Charged Particle Optics

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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Author(s): Erwin Kasper (Eds.)
Series: Advances in Imaging and Electron Physics 116
Edition: 1
Publisher: Elsevier, Academic Press
Year: 2001

Language: English
Pages: 1-451

Content:
Preface
Page xi
Peter Hawkes

Future contributions
Pages xiii-xvi

Acknowledgments
Page xvii

Introduction
Pages xix-xxiii

Chapter I Basic field equations Original Research Article
Pages 1-30

Chapter II Reducible systems Original Research Article
Pages 31-57

Chapter III Basic mathematical tools Original Research Article
Pages 59-114

Chapter IV The finite-difference method (FDM) Original Research Article
Pages 115-191

Chapter V The finite-element method (FEM) Original Research Article
Pages 193-261

Chapter VI The boundary element method Original Research Article
Pages 263-356

Chapter VII Hybrid methods Original Research Article
Pages 357-432

Index
Pages 433-451