Noise in Physical Systems and 1 over F Fluctuations

Committee Members......Page 6
Preface......Page 8
CONTENTS......Page 10
I. Plenary Lectures......Page 28
Kinetic Theory of Fluctuations: Forty Years in Progress (Invited)......Page 30
Noise in Nanoscale Devices (Invited)......Page 36
Frontiers of Noise Research (Invited)......Page 42
II. Materials......Page 44
Mesoscopic Noise Experiments on Colossal Magnetoresistance (Invited)......Page 46
1/f Noise in Thin Single Domain Ni80Fe20 Films (Invited)......Page 52
Local Magnetic Order in Manganite Thin Films Studied by 1/f Noise Measurements......Page 58
1/f Voltage Noise Induced by Magnetic Flux Flow in Granular Superconductors......Page 62
Nature of Sharp Temperature Dependency of Normal Phase Flicker Noise of Epitaxial YBa2Cu3O7-x Films......Page 66
Noise Transport and Structural Properties of High-Tc YBa2Cu3O7-x Films with Noise Hooge-parameter in Normal State Near to 10-6......Page 70
Dynamics of Individual Traps in Submicron High-temperature Superconductor Grain Boundary Junctions......Page 74
Large Conductance Noise in Ceramic High Tc Superconductors Submitted to a Low Frequency A.C. Magnetic Field......Page 78
Voltage Fluctuations Associated with Unbinding of Vortex Pairs in the Presence of Current......Page 82
Current-induced Voltage Noise and Vortex Dynamics in Thick a-MoxSi1-x Films......Page 86
Low-Frequency Noise in Gallium Nitride Thin Films Deposited by rf-plasma Assisted MBE on Intermediate-Temperature Buffer Layers (Invited)......Page 90
Generation-recombination Noise in Si-doped AIN......Page 96
Non-equilibrium Flicker Noise in Conducting Films and Thin Film Resistors......Page 100
Dependence of Current 1/f Noise of VOx Films on Their Phase Composition and Structure......Page 104
Low Frequency Noise and Non-Linear Transport in Charge-ordered Manganites......Page 108
1/f Noise in Undoped Hydrogenated Amorphous Silicon and Silicon-germanium Alloys (Invited)......Page 112
Low Frequency Noise of Thin Ta205 Amorphous Films......Page 118
Low Frequency Noise Analysis of Different Types of Polysilicon Resistors......Page 122
1/f Resistance Fluctuation of the Carbon Fiber......Page 126
Spin-Dependent Noise......Page 130
Universal Conductance Fluctuations and Scale Invariance Near the Metal-insulator Transition......Page 134
Temperature and Doping Dependence of Conductivity Noise in Degenerately Doped Si Single Crystals......Page 138
Experimental Study of 1/f Fluctuations at Nonequilibrium Phase Transitions......Page 142
Evaluation of Ni/n-SiC Ohmic Contacts by Current Noise Measurements......Page 146
III. Devices......Page 150
III.1 MOS Transistors......Page 152
Lorentzian Components in Low-frequency Noise Spectra of SOI MOSFETs (Invited)......Page 154
On the 1/f Noise in Fully Depleted SOI Transistors......Page 160
Low Frequency Noise Characterization in 0.18 um Technology n and p Channel MOSFETs......Page 164
Effect of Forward and Reverse Substrate Biasing on Low Frequency Noise in Silicon P-MOSFETs......Page 168
Low Frequency Noise in CMOS Transistors: An Experimental and Comparative Study on Different Technologies......Page 172
Impact of Gate Engineering and Silicidation on Low Frequency Noise Characteristics in 0.18 um Technology MOSFETs......Page 176
A Comparison of 1/f Noise of 0.25 um-NMOS and PMOS Transistors from Deep-subthreshold to Strong Inversion......Page 180
On-wafer Low Frequency Noise Investigation of the 0.35 um n and p Type MOSFETs Dependence Upon the Gate Geometry......Page 184
Low Frequency Noise in Poly-Si- and Poly-SiGe-gated MOSFETs......Page 188
Gate Leakage Current Noise in Ultra-thin Gate Oxide MOSFETs......Page 192
Phonon-induced 1/f Noise in MOS Transistors......Page 196
The Characteristic Potential Method of 1/f Noise Calculation in Si nMOSFETs......Page 200
Flicker Noise in Submicron MOSFETs with 3.5 nm Nitrided Gate Oxide......Page 204
High-frequency noise of MOSFETs......Page 208
III.2 Diodes and Bipolar Transistors......Page 212
Low Frequency Noise in Avalanche Breakdown of PN Junction Diodes (Invited)......Page 214
PN Junction Local Avalanche Breakdown Induced Microplasma Noise in Semiconductor GaAsP Diodes......Page 220
Analysis of Low Frequency Noise in Resonant Tunneling Diodes......Page 224
Low Frequency Noise in InP/InGaAs Heterojunction Bipolar Transistors with Different Technologies......Page 236
Modeling the Level and Variation in the Low-frequency Noise in Polysilicon Emitter Bipolar Transistors......Page 232
Modeling of Current Transport and 1/f Noise in GaN Based HBTs......Page 240
Microscopic Analysis of Microwave Noise Sources in SiGe HBTs......Page 244
A Stochastic Approach to Characterize the Noise Behavior of Microwave Transistors......Page 248
III.3 HEMTs TFTs and Other Electron Devices......Page 252
Investigation of Low-frequency Noise in Heterostructure Field-effect Transistors Based on Wide Band Gap Semiconductors (Invited)......Page 254
Low Frequency Noise in Gate Current of HEMT Structures......Page 260
LF Gate Noise in P-HEMT in Impact Ionization Regime......Page 264
Experimental Investigation of the Dependence of 1/f Noise on Ids/gm2 in the Pseudomorphic HEMT at 4.2 K......Page 268
Noise Optimization of Ultra-short Gate HEMTs Using Monte Carlo Simulation......Page 272
Low Frequency Drain Current Noise of GaAs Based PHEMTs......Page 276
Excess Noise in Al/I-GaAs Barrier Structures Used as X-ray and Charged Particles Detectors......Page 280
Low Frequency Noise in CdSe Thin Film Transistors {Invited)......Page 284
Model of Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors......Page 290
Conduction and Low-frequency Noise in Polysilicon Thin Film Transistors......Page 294
1/f Noise in Organic Thin-Film Transistors (Invited)......Page 298
Low Frequency Noise in Polymer Transistors with Non-stationary Mobility......Page 304
1/f Noise in Organic Thin Film Transistors: Dependence on Geometry Bias and Illumination......Page 308
A Global Approach to the Noise and Small-signal Characterization of Microwave Field-Effect Transistors......Page 312
Shot Noise in Macroscopic Resistors: A Predicted Experimental Evidence......Page 316
Instabilities and Fluctuations in Semiconductor Solid-state Plasma......Page 320
III.4 Optical Devices......Page 324
Intensity Optical Noise in Low and Medium Frequency Range of 0.85 and 1.55 um Vertical Surface Emitting Lasers......Page 326
Theoretical Investigation of Mode-Competition Noise in Semiconductor Lasers Including Asymmetric Cross-Saturation of Gain......Page 330
Numerical Simulation of Intensity and Phase Fluctuations in Long-wavelength Lasers......Page 334
Spectral Density of Frequency Fluctuations in Semiconductor Laser Under Pseudorandom Pulsed Operation......Page 338
Optical and Electrical Noise of Ridge Waveguide InGaAsP/InP F-P and DFB MQW Lasers......Page 342
NIST Program on Relative Intensity Noise Standards for Optical Fiber Sources Near 1550 nm......Page 346
Electrical Noise Characterization of N-type-doped Distributed Bragg Mirrors......Page 350
Evidence of Deep Levels in N-type-doped Distributed Bragg Mirrors Through Electrical Noise Characterization......Page 354
Temperature Dependence of the 1/f Noise of "hot" HgCdTe IR Detectors......Page 358
Experimental Study of the Current Noise Spectral Density Versus Dark Current in CdTe: CI and CdZnTe Detectors......Page 362
Physical Model of the Current Noise Spectral Density Versus Dark Current in CdTe Detectors......Page 366
Effects of Permanent Magnetic Fields on 1/f Noise in Ion-Implanted Mercury Cadmium Telluride Photodiodes......Page 370
Effect of Coulomb Interaction on Noise in Quantum Well Infrared Photodetectors......Page 374
III.5 RTS......Page 378
The Effects of Charge Quantization on Random Telegraph Signals in Deep-sub-micron MOSFETs (Invited)......Page 380
Temperature Controlled RTS Noise from a Single InGaAs Quantum Dot (Invited)......Page 386
Model for RTS Noise in Sub-micron MOSFETs......Page 392
Random Telegraph Noise in Microstructures (Invited)......Page 396
Softbreakdown and RTS in Gate and Drain Currents of MOS Transistors with Ultrathin Oxides......Page 402
Time and Frequency Study of RTS in Bipolar Transistors......Page 406
Temperature Dependent RTS Noise in SiGe HBTs......Page 410
RTS Noise Due to Electrostatic Discharge (ESD) Stress-induced Localized Damage in the Channel of Grounded-gate nMOS ESD Protection Devices......Page 414
Simulation and Measurement of RTS Noise in N-channel MOSFETs Under Switched Bias Conditions......Page 418
IV. Biological Systems......Page 422
Brownian Machinery in Physics and Biology (Invited)......Page 424
How Fast Can a Neuron Transfer Information: Bandwidth is the Real Issue......Page 427
Fluctuations of Cars and Neural Spikes at Junctions......Page 431
Nonlinear Stochastic Models of Neurons Activities......Page 435
Neural Network Based Adaptive Processing of Electrogastrogram......Page 439
A Numerical Analysis of Stochastic Phenomena in One-dimensional Two-state Systems......Page 443
Colored Noise Driven Stochastic Resonance in a Double Well and in a Fitzhugh-Nagumo Neuronal Model......Page 447
Noise-induced Oscillations and Coherent Resonance in Chemical System......Page 452
V. Mesoscopics......Page 456
Monte Carlo Simulations of Mesoscopic Shot Noise (Invited)......Page 458
Background Charge Noise in Metallic Single Electron Transistors (Invited)......Page 464
Enhanced Shot Noise and Negative Differential Conductance in Quasi-Ballistic Single-barrier Diodes......Page 470
Shot Noise Enhancement and Suppression in Systems of Coupled Quantum Dots......Page 474
Noise Properties of Ballistic Exclusions......Page 478
Shot Noise Suppression in Single and Multiple Ballistic and Diffusive Cavities......Page 482
Numerical Simulations of Weak Localization Correction to Shot Noise in Degenerate Disordered Conductors in Reduced Dimensions......Page 486
Shot Noise as a Test of Entanglement and Nonlocality of Electrons in Mesoscopic Systems......Page 490
Shot Noise in Hybrid Superconductor/normal Metal Heterostructures at Mesoscopic Scale......Page 493
VI. Oscillators and Phase Noise......Page 498
Noise Properties of Microwave Oscillators Based on Sapphire Loaded Cavity Resonators (Invited)......Page 500
The Influence of the Main Noise Sources on Frequency Stability of the Quantum Frequency Standard......Page 506
Measurement of Long-term Frequency Stability of High Quality Oscillators in the Presence of Flicker-noises......Page 510
The Readout of Time Continued Fractions and 1/f Noise......Page 514
Learning from Noise in Chua's Oscillator......Page 518
Advanced Phase Noise Measurement Methods......Page 522
Up-conversion of 1/f Noise to Phase Noise in Voltage Controlled Oscillators......Page 526
Correlation Between Phase and Amplitude Noises and 1/f Phase Noise Reduction Methods in Oscillators & PLL (Phase-locked Loop) Systems......Page 530
VII. Quantum Confined Structures......Page 534
Effects of Quantum Confinement on Low Frequency Noise in 8-Doped GaAs Structures Grown by MBE......Page 536
Longitudinal and Transverse Noise of Hot Electrons in 2DEG Channels......Page 540
High-frequency Noise in InAlAs/InGaAs/InAIAs Quantum-well Channels......Page 544
Microwave Noise in GaSb/AlSb/InAs/AlSb/GaSb/GaAs Quantum Well Channel......Page 548
Noise of a Quantum-dot System in the Cotunneling Regime......Page 552
VIII. Circuits and Systems......Page 556
Effects of Substrate Resistances on the Noise Performance of RF Circuits Implemented in Silicon-based Technologies (Invited)......Page 558
The ADC-transformation of Probability Characteristics of Gaussian Noise......Page 564
1/f Noise in the Multi-agent Cooperative Routing......Page 568
High Signal-to-noise Ratio Gain by Stochastic Resonance in a Double Well......Page 572
S/N Optimization and Noise Considerations for Piezoresistive Microphones......Page 576
IX. Theory......Page 580
On the Additivity of Generation-recombination Spectra (Invited)......Page 582
Electronic Noise Due to Multiple Trap Levels Discrete or Continuously Distributed: A Near-Exact Result for the Envelope Spectrum (Invited)......Page 588
Sharp Increase of 1/f Noise Owing to Clusterization of Adatoms at Crystal Surfaces of Metals and Light Impurities in the Bulk......Page 595
1/f Noise Intermittency and Clustering Poisson Process......Page 599
1/f Noise Due to Diffusion of Impurity Centers in Semiconductors......Page 603
1/f Noise and Self-organization in Granular Superconductors......Page 607
New Insights on Fundamental 1/f Noise Theory and Applications (Invited)......Page 611
1/f Noise of the Density of States of an Electron Gas......Page 617
Information Transmission in Parallel Threshold Networks: Suprathreshold Stochastic Resonance and Coding Efficiency......Page 621
Green Noise in Stochastic Systems......Page 625
The Role of the Initial Conditions on the Enhancement of the Escape Time in Unstable States......Page 629
Stochastic Properties of Deterministic Systems......Page 633
Hypersensitivity to Small Signals in a Stochastic System with Multiplicative Noise......Page 637
Noise Enhanced Stability in Systems with Fluctuating Potentials......Page 639
Bifurcations of Mechanical Systems Under Multiplicative Noise......Page 643
Characterization of Noisy Waveforms by Means of Wavelet Techniques......Page 647
Self-organized Criticality and 1/f Fluctuations at Nonequilibrium Phase Transitions......Page 651
X. Modeling and Simulation......Page 656
Noise Modeling for PDE Based Device Simulations (Invited)......Page 658
Modeling and Simulation of Thermal Noise in Deep-submicron MOSFETs......Page 664
1/f-like Oxide Trapping Noise Simulation Using a PDE-based Device Simulator......Page 668
Simulation of Generation-recombination Noise of Resistors and Junctions Under Periodic Large-signal Steady-state Conditions......Page 672
Fundamental and Equivalent Cyclostationary Microscopic Noise Sources for LS Device Simulation......Page 676
Non-linear Noise in High-Frequency Devices (Invited)......Page 680
An Accurate and Efficient Methodology for RF Noise Simulations of nm-scale MOSFETs Based on Langevin-type Drift-diffusion Model......Page 686
The Acceleration Scheme for Noise Modeling of Deep Submicron Devices (Invited)......Page 690
Comments About 1/f Noise Modeling by BSIM Software......Page 696
A Comment on MESFET Noise Models Used in Electrical Simulators for Analog Design......Page 700
Monte Carlo Simulation of Electronic Noise Under Large-signal Operation......Page 704
Modeling and Simulation of 1/f Noise in MOSFETs Based on Thermal-activated Mechanism and Monte Carlo Approach......Page 708
Scaling and Universality of Resistance Noise Near to Electrical Breakdown (Invited)......Page 712
Influence of Magnetic Field on 1/f Noise and Thermal Noise in Multi-terminal n-GaAs Resistors......Page 718
XI. Measurement Aspects......Page 722
Ultra Low-noise Cryogenic Correlation Amplifier for Shot Noise Measurements......Page 724
Low Frequency Noise Point Probe Measurements on a Wafer Level Using a Novel Programmable Current Amplifier......Page 728
Current Noise Measurement with a Correlation Spectrum Analyzer......Page 732
Simultaneous Measurement of Current and Voltage Noise in a GaN-resistor......Page 736
A Further Improvement of the Measuring Technique of Bulk and Contact Components of Resistance Noise......Page 740
The Comparative Analysis of Methods of the 1/f Noise Non-gaussianity Test......Page 744
Fully Computer-controlled Battery Power Source for Low-Frequency Noise Measurements......Page 748
Methods of Slope Estimation of Noise Power Spectral Density......Page 752
The Influence of ADC and FFT on the Spectrum Estimation......Page 756
XII. Reliability Diagnostics and Spectroscopy......Page 760
A Percolative Approach to Current Fluctuations in the Soft Breakdown of Ultrathin Oxides......Page 762
Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells......Page 766
Reliability and Low-frequency Noise Measurements of InGaAsP MQW Buried-Heterostructure Lasers......Page 770
Low-frequency Noise and Third Harmonic Testing of Thick-Film Resistors as Reliability Indicators......Page 774
On Electrical Noise and Reliability of Semiconductor Lasers......Page 778
1/f noise in W03 Nanoparticle Films as a Diagnostic Tool......Page 782
Noise Diagnostics of Insulating Materials for Operation at High Temperature......Page 786
Analysis of LF Noise Evolution in Power HEMT After DC Step Lifetests......Page 790
Noise Measurements for Material Dielectric Characterization: Application to a Liquid Crystal......Page 794
Physical Properties of Nanostructured Semiconductors Studied via Flicker Noise Spectroscopy......Page 798
Flicker-noise Spectroscopy as a Tool for Analysis of Fluctuations in Physical Systems......Page 802
How Can Noise "Smell" and Remember that "Smell": Sampling-and-hold Electronic Nose......Page 806
Noise Measurements for Timing Purposes: An Application to Organic Semiconductors......Page 811
XIII. Miscellaneous......Page 816
1/f and 1/f2 Noise in Financial Time Series (Invited)......Page 818
1/f Noise: An Appropriate Stochastic Process for Ecology......Page 824
Orbital Noise in the Earth System and Climate Fluctuations......Page 828
Characteristics of the Ground Observed ULF Emissions and their Dynamics Depending on Solar Wind Parameters and Geomagnetic Conditions......Page 832
XIV. Late Paper......Page 836
Noise in State of the Art Clocks and their Impact for Fundamental Physics (Invited)......Page 838
Author Index......Page 844