Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them. Topics include: Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information
Author(s): N. John DiNardo
Edition: First Edition
Publisher: Wiley-VCH
Year: 1994
Language: English
Pages: 177
City: Weinheim ; New York
Tags: Специальные дисциплины;Наноматериалы и нанотехнологии;Методы исследования наноматериалов;
Nanoscale Characterization of Surfaces and Interfaces......Page 2
Nanoscale Characterization of Surfaces and Interfaces......Page 14
List of Symbols and Abbreviations......Page 16
1 Introduction......Page 19
2.1 Historical Perspective......Page 25
2.2 Theory......Page 29
2.2.1 Electron Tunneling and STM Imaging......Page 30
2.2.2 Scanning Tunneling Spectroscopy (STS)......Page 35
2.2.3 Inelastic Tunneling Spectroscopy......Page 40
2.2.4 Ballistic Electron Emission Microscopy (BEEM)......Page 42
2.3 Instrumentation......Page 44
2.3.1 Microscope Design: STM Heads......Page 45
2.3.2 Tips......Page 51
2.3.3 Vibration and Shock Isolation......Page 52
2.3.4 Electronics......Page 53
2.4.1 Si(111)......Page 56
2.4.2 Si(100)......Page 60
2.4.4 Photoinduced Processes......Page 63
2.5 Metal–Semiconductor Interfaces......Page 64
2.5.1 AlkaliMetal–Semiconductor Interfaces......Page 65
2.5.2 Growth of Trivalent Metals on Si(001)......Page 66
2.5.3 Ambiguities in Structural Determinations......Page 67
2.5.4 Electron Localization at Defects in Epitaxial Layers......Page 69
2.5.5 EF Pinning, Mid-Gap States, and Metallization......Page 71
2.5.7 Microscopy and Spectroscopy of Buried Interfaces – BEEM......Page 73
2.6 Metal Surfaces......Page 77
2.6.1 Close-Packed Surfaces......Page 79
2.6.2 Surface Diffusion......Page 80
2.6.3 Stepped Surfaces......Page 81
2.6.4 Adsorbate-Induced Reconstructions of Metal Surfaces......Page 83
2.6.6 Resistivity in Polycrystalline Metals – Scanning Tunneling Potentiometry......Page 87
2.7 Insulators......Page 88
2.8 Layered Compounds......Page 92
2.9 Charge Density Wave Systems......Page 99
2.10 Superconductors......Page 105
2.11.1 Molecular Imaging......Page 109
2.11.2 Adsorption and Surface Chemistry......Page 110
2.12 Electrochemistry at Liquid–Solid Interfaces......Page 121
2.1 3 Biological Systems......Page 124
2.14 Metrological Applications......Page 128
3 Atomic Force Microscopy......Page 131
3.1 Atomic Force Imaging......Page 136
3.1.1 Graphite......Page 137
3.1.3 Metals......Page 138
3.1.4 Films......Page 139
3.1.5 Polymer Surfaces and Metal Films on Polymer Substrates......Page 140
3.1.6 Biological Molecules......Page 141
3.1.7 Adsorption Dynamics of Biological Molecules in Real Time......Page 142
3.2 Nanoscale Surface Forces......Page 143
3.3 Nanotribology......Page 145
3.4.1 Van der Waals Forces......Page 146
3.4.2 Electrostatic Forces......Page 147
3.4.3 Magnetic Forces......Page 148
4 Manipulation of Atoms and Atom Clusters on the Nanoscale......Page 150
4.1 Transfer of Atoms and Atom Clusters Between Tip and Sample......Page 151
4.2 Tip-Induced Lateral Motion of Atoms on Surfaces......Page 152
4.3 Nanoscale Modification by Tip-Induced Local Electron-Stimulated Desorption......Page 154
4.6 Nanoscale Surface Modification Using the AFM......Page 155
4.7 Towards Nanoscale Devices......Page 156
5.1 Scanning Near-Field Optical Microscope (SNOM)......Page 157
5.2 Photon Scanning Tunneling Microscope (PSTM)......Page 158
5.3 Scanning Thermal Profiler (STP)......Page 159
5.4 Scanning Chemical Potential Microscope (SCPM)......Page 160
5.5 Optical Absorption Microscope (OAM)......Page 162
5.6 Scanning Ion Conductance Microscope (SICM)......Page 163
7 References......Page 164
Index
......Page 172
