This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.
Author(s): Gunturi Venkata Sitarama Sastry
Series: Indian Institute of Metals Series
Publisher: Springer
Year: 2022
Language: English
Pages: 253
City: Singapore
Series Editor’s Preface
About the Indian Institute of Metals
Genesis and History of the Series
Current Series Information
Foreword
Acknowledgements
Contents
About the Author
1 Introduction
1.1 Requirement to `See'
1.2 The New Definition
1.3 Scope of the Book
2 Electromagnetic Waves and Electron Waves
2.1 Interference and Diffraction
2.2 Charged Particle-Wave Optics
2.3 Electrostatic and Electromagnetic Lenses
2.3.1 Electrostatic Lenses
2.3.2 Electromagnetic Lenses
2.3.3 The Lens Parameters
3 Fourier Analysis and Fourier Transformation
3.1 Fourier Analysis
3.1.1 Fourier Coefficients
3.1.2 Exponential Series
3.2 Fourier Transforms
4 Transmission Electron Microscope
4.1 Constituents of a Modern TEM
4.2 Illumination System
4.2.1 Electron Gun
4.2.2 Condenser Lens System
4.3 Image Forming System
4.4 Viewing and Recording
4.4.1 Digital Image Recording
5 Electron Diffraction
5.1 Laue Diffraction
5.2 Bragg's Law
5.2.1 Reciprocal Lattice
5.2.2 Stereographic Projection
5.3 Representation of Electron Diffraction in Reciprocal Space
5.4 Intensity of a Diffracted Beam From a Thin Crystal Under Kinematical Conditions
5.5 Indexing of Electron Diffraction Patterns
5.5.1 Ratio Method
5.5.2 Kikuchi Lines and Kikuchi Patterns
5.6 Determination of Orientation Relationships
5.6.1 Matrix-Twin Orientation Relation
5.6.2 Precipitate-Matrix Relation
5.7 Effect of Ordering of the Crystal
5.8 When the Material is Having Amorphous Structure
5.9 Convergent Beam Electron Diffraction
5.9.1 The Instrument
5.9.2 The Procedure
5.9.3 Measurements
5.9.4 Zone Axis Pattern and Zero Disc Patterns
5.9.5 Defect Analysis
5.10 Other Diffraction Techniques
5.10.1 Precession Electron Diffraction
6 Optical Microscopy
6.1 Limit of Resolution and Resolving Power
6.1.1 Abbe's Theory of Image Formation
6.1.2 Rayleigh Criterion
6.1.3 Possibilities of Extending Resolution Limits
6.2 Magnification, Depth of Focus and Depth of Field
6.3 Lens Aberrations
6.3.1 Spherical Aberration
6.3.2 Chromatic Aberration
6.3.3 Astigmatism and Coma
6.3.4 Curvature of Image Plane
6.3.5 Distortions
6.4 A Compound Metallurgical Microscope
6.4.1 Objectives and Oculars
6.5 Polarised Light Microscopy
6.5.1 Birefringence
6.5.2 The Microscope
6.6 Interference Microscopy
6.6.1 Interference-Fringe Microscopy
6.6.2 Interference Contrast Microscopy or DIC Microscopy
7 Transmission Electron Microscopy
7.1 Importance of Contrast
7.2 Diffraction Contrast
7.2.1 Thickness Fringes
7.2.2 Bend Contours
7.2.3 Contrast from Crystals with Imperfections
7.2.4 Contrast from Epitaxial Layers
7.2.5 Contrast from Polymeric Materials and Polymer-Based Composites
7.3 Phase Contrast
7.3.1 Requirements on the Part of Microscope
7.3.2 Image Formation
7.4 Differential Energy Contrast
7.5 Contrast Mechanisms in STEM
7.6 Magnetic-Moment Contrast
7.6.1 Lorentz Microscopy
7.7 Electron Holography Contrast
7.7.1 In-Line Holography
7.7.2 Off-Axis Holography
8 Lensless Electron Microscopy
8.1 Scanning Electron Microscope
8.1.1 A Schematic Layout of the Microscope
8.1.2 Types of Signals Generated by the Specimen
8.1.3 Principal Modes of Operation
8.1.4 Resolution
8.1.5 Contrast
8.1.6 Depth of Field
8.1.7 Enhancing the Resolution and Other Capabilities of SEM
8.1.8 Electron Backscattered Diffraction
Appendix A Stereographic Projection
A.1 Projection Method
A.1.1 Important Properties
A.1.2 Construction of Wulff Net with Desired Diameter and Intervals of Lines
A.1.2.1 Non-orthogonal crystal systems
A.1.3 Applications
Appendix B Basic Crystallography
B.1 Unit Cell and Primitive Cell
B.2 Crystal Systems and Bravais Lattices
Appendix C Cosine Formulae
C.1 Table of Cosines
Appendix D Illumination Systems for Optical Microscopes
D.1 Important Parameters
D.1.1 Mercury Arc Lamps
D.1.2 Metal Halide Lamps
D.1.3 Light Emitting Diodes
Appendix References
