Metallization of Polymers

Content: The present state of metallized polyimide / Edward Sacher --
Photoelectron spectroscopies applied to polymer-metal interactions / Steven P. Kowalczyk --
Using near-edge soft X-ray absorption spectroscopy to study organic polymers and metal-polymer interactions / Jean L. Jordan-Sweet --
High-resolution electron energy loss spectroscopy : application to polymer surfaces and polymer- metal interactions / Jean-Jacques Pireaux, Ch. Grégoire, M. Vermeersch, P.A. Thiry, M. Rei Vilar, and R. Caudano --
Plasma- and corona-modified polymer surfaces : characterization by static secondary ion mass spectrometry / W.J. van Ooij and R.S. Michael --
Depth profiles of thin films and interfaces by the elastic recoil detection technique / S.C. Gujrathi --
Quantitative trace element analysis by proton-induced X-ray emission / A.J. Houdayer, P.F. Hinrichsen, and J.-P. Crine --
Trace element determination in polymers by neutron activation / Gregory G. Kennedy --
Morphology of polymer chains by transmission electron microscopy / Yvon P. Carignan, Masanori Hara, and Frederic Cosandey --
Polymer surface modification by dual-frequency plasma treatment / M.H. Bernier, J.E. Klemberg-Sapieha, L. Martinu, and M.R. Wertheimer --
Polyimide surface degradation : X-ray photoelectron spectroscopic study under UV-pulsed laser irradiation / M. Chtaïb, E.M. Roberfroid, Y. Novis, Jean-Jacques Pireaux, and R. Caudano --
Metal-filled polymers : surface modification by plasma deposition / L. Martinu, V. Pische, and R. d'Agostino --
Wet-process surface modification of polyimides : adhesion improvement / Kang-Wook Lee and Steven P. Kowalczyk --
Sensitivity of plasma fluorinated polyimide and poly(tetrafluoroethylene) to high-energy ion beams during Rutherford backscattering spectroscopy / F. Emmi, L.J. Matienzo, D.C. VanHart, and J.J. Kaufman --
Surface analysis of polymers by ionic spectrometries : X-ray photoelectron spectroscopic evaluation of ion bombardment damages / Y. De Puydt, D. Leonard, and P. Bertrand --
Thermal stability of electron-irradiated poly(tetrafluoroethylene) : X-ray photoelectron and mass spectroscopic study / Donald R. Wheeler and Stephen V. Pepper --
Novel process for surface modification of polyimide / N.L.D. Somasiri, T.A. Speckhard, and R.L.D. Zenner --
Reactions of metal atoms with monomers and polymers / Mark P. Andrews --
Reactions of metal powders with organic polymers / John Delmonte --
Reaction during the sputtering of metals onto polyimide / A. Domingue, L. Dignard-Bailey, Edward Sacher, A. Yelon, and T.H. Ellis --
Aluminum-polyester corrosion : an X-ray photoelectron spectroscopic study / M. Chtaïb, Y. Novis, R. Caudano, P. Lutgen, and G. Feyder --
Metal-polyimide interfaces characterized by secondary ion mass spectroscopy / B.K. Furman, S. Purushothaman, E. Castellani, S. Renick, and D. Neugroshl --
Model systems for polyimide-on-copper interface / S. Stafström, P. Bodö, W.R. Salaneck, and J.L. Brédas --
Polyimide-copper interface : model study using photoelectron spectroscopy / P. Bodö, K. Uvdal, S. Stafström, and W.R. Salaneck --
Aluminum-polyimide interface / A. Selmani --
Solventless polyamic acid : consequences for reactivity with metals / T. Strunskus, M. Grunze, and S. Gnanarajan --
Characterization of the poly(ether ether ketone)-copper interface : preliminary electron spectroscopy for chemical analysis / R.D. McElhaney, D.G. Castner, and B.D. Ratner --
Langmuir Blodgett film-metal interfaces : static secondary ion mass spectrometry and electron spectroscopy for chemical analysis / Paula A. Cornelio and Joseph A. Gardella, Jr. --
Redox seeding and electroless metallization of polyimides / A. Viehbeck, C.A. Kovac, S.L. Buchwalter, M.J. Goldberg, and S.L. Tisdale --
Adhesion of metals to thin-film fluorocarbon polymers / Chin-An Chang, Yong-Kil Kim, and A.G. Schrott --
Polypropylene and aluminum adhesion : improvement by N₂ low-pressure plasma treatment / V. André, Y. De Puydt, F. Arefi, J. Amouroux, P. Bertrand, and J.F. Silvain --
X-ray photoelectron spectroscopy of modified polymer surfaces and metal-polymer interfaces : correlations with adhesion / L.J. Gerenser --
Cristallographic structure and adhesion of aluminum thin films deposited on mylar / J.F. Silvain, J.J. Ehrhardt, A. Picco, and P. Lutgen --
Chemical bonding and morphology of interfaces in aluminized silicones from evaporation and sputtering / Y. Jugnet, J.L. Droulas, Tran Minh Duc, and A. Pouchelon --
Polyetherimide surfaces chemically treated to improve adhesion to electroless copper / Donald F. Foust and William V. Dumas --
Intrinsic bond strength of metal films on polymer substrates : a new method of measurement / Donald R. Wheeler and Hiroyuki Osaki.