Many applications today require the Fourier-transform (FT) spectrometer to perform close to its limitations, such as taking many quantitative measurements in the visible and in the near infrared wavelength regions. In such cases, the instrument should not be considered as a perfect 'black box.' Knowing where the limitations of performance arise and which components must be improved are crucial to obtaining repeatable and accurate results. One of the objectives of this book is to help the user identify the instrument's bottleneck.
Contents
- Preface
- Spectroscopy Instrumentation
- Signal-to-Noise Ratio
- Principles of Interferometer Operation
- Interferometer Alignment Errors
- Motion Components and Systems
- Interferogram Data Sampling
- Data Acquisition
- The Detector
- Consideration of Optics and Interferometer Alignment
- Signal-to-Noise Ratio Enhancement Techniques
- Appendix A: Simulation of Static-Tilt Error
- Appendix B: Sampling Circuit Example
- Appendix C: Simulation of Sampling Error
- Index
Author(s): Saptari, Vidi
Series: SPIE tutorial texts TT61
Publisher: SPIE Publications
Year: 2004
Language: English
Pages: 118
City: Bellingham, Wash
Tags: Приборостроение;Обработка сигналов;
Content: Preface --
Chapter 1 Spectroscopy Instrumentation --
1.1 Introduction --
1.2 Types of Spectrometers --
1.3 Advantages of FT Spectrometers --
1.4 Discussions on FT Spectrometer Advantages --
References --
Chapter 2 Signal-to-Noise Ratio --
2.1 Signal-to-Noise Ratio Defined --
2.2 Quantifying Signal-to-Noise Ratio --
2.3 Practical Considerations --
Chapter 3 Principles of Interferometer Operation --
3.1 Overview --
3.2 Quantitative Explanation --
3.3 Theoretical Resolution --
3.4 Interferogram Digital Processing --
References --
Chapter 4 Interferometer Alignment Errors --
4.1 Error Characteristics --
4.2 Interferogram-Modulation Error --
4.3 Interferogram-Sampling Error --
References --
Chapter 5 Motion Components and Systems --
5.1 Actuators --
5.2 Driver and Amplifier --
5.3 Bearings and Coupling Mechanism --
5.4 Position Sensor --
5.5 Homodyne Interferometer Sources of Error --
5.6 Actuator, Sensor, and Mirror Mounting --
5.7 Digital Motion Controller --
References. Chapter 6 Interferogram Data Sampling --
6.1 Step Scan vs. Continuous Scan --
6.2 Sampling Period --
6.3 Accuracy with Respect to OPD --
6.4 Repeatable Clock Position --
6.5 Hardware Methods --
References --
Chapter 7 Data Acquisition --
7.1 DAQ Hardware Formats --
7.2 Analog Inputs --
7.3 Hardware Triggering and Clock Signal --
7.4 Effects of ADC Resolution on Spectral SNR --
Chapter 8 The Detector --
8.1 Noise-Equivalent-Power --
8.2 Spectral SNR quantification --
8.3 Detector Types --
8.4 Selection Guidelines --
References --
Chapter 9 Consideration of Optics and Interferometer Alignment --
9.1 System Throughput --
9.2 Lenses vs. Mirrors --
9.3 Interferometer Alignment Procedure --
Chapter 10 Signal-to-Noise Ratio Enhancement Techniques --
10.1 Identification of Error Sources --
10.2 Averaging --
10.3 Temporal Modulation and Bandwidth Narrowing --
10.4 Spectral-Bandwidth Narrowing --
10.5 Spectral Post-Processing --
10.6 Double Beaming --
10.7 Gain ranging --
10.8 Dynamic Tilt Compensation --
References --
Appendix A Simulation of Static-Tilt Error --
Appendix B Sampling Circuit Example --
Appendix C Simulation of Sampling Error --
Index.
