This book describes a comprehensive combination of methodologies that strongly enhance the modern Virtual Prototype (VP)-based verification flow for heterogeneous systems-on-chip (SOCs). In particular, the book combines verification and analysis aspects across various stages of the VP-based verification flow, providing a new perspective on verification by leveraging advanced techniques, like metamorphic testing, data flow testing, and information flow testing. In addition, the book puts a strong emphasis on advanced coverage-driven methodologies to verify the functional behavior of the SOC as well as ensure its security.
- Provides an extensive introduction to the modern VP-based verification flow for heterogeneous SOCs;
- Introduces a novel metamorphic testing technique for heterogeneous SOCs which does not require reference models;
- Includes automated advanced data flow coverage-driven methodologies tailored for SystemC/AMS-based VPs;
- Describes enhanced functional coverage-driven methodologies to verify various functional behaviors of RF amplifiers.
Author(s): Muhammad Hassan, Daniel Große, Rolf Drechsler
Publisher: Springer
Year: 2022
Language: English
Pages: 180
City: Cham
Preface
Acknowledgments
Contents
List of Algorithms
List of Figures
List of Tables
1 Introduction
1.1 Electronic System-Level Design and Verification
1.2 Book Contribution
1.2.1 Contribution Area 1: AMS Metamorphic Testing Environment
1.2.2 Contribution Area 2: AMS Enhanced Code Coverage Verification Environment
1.2.3 Contribution Area 3: AMS Enhanced Functional Coverage Verification Environment
1.2.4 Contribution Area 4: Digital Early Security Validation
1.2.5 Contribution Summary
1.3 Book Organization
2 Preliminaries
2.1 SystemC
2.1.1 Basics
2.1.2 Transaction-Level Modeling (TLM)
2.2 SystemC AMS
2.2.1 Models of Computation (MOC)
2.2.2 Timed Data Flow (TDF)
Example: Low Pass Filter (LPF)
3 AMS Metamorphic Testing Environment
3.1 MT-Based System-Level Verification Approach
3.1.1 Overview
3.1.2 Test-Case Generator
3.1.3 Metamorphic Relations
3.1.4 Core Properties
3.2 Metamorphic Testing for RF Amplifiers
3.2.1 MT Principle for RF Amplifiers
3.2.2 Identification of Metamorphic Relations
3.2.3 Experimental Evaluation
LNA Model and Experimental Setup
MT-Based Verification Results
Fault-Detection Quality of MT-Based Verification
3.3 Metamorphic Testing for PLLs
3.3.1 Phase-Locked Loop
3.3.2 MT Principle for Mixed-Signal Interactions
3.3.3 Identification of MRs for PLLs
3.3.4 Experiments
Overview
MT-Based Verification of PLL
3.4 Summary
4 AMS Enhanced Code Coverage Verification Environment
4.1 Software Driven Verification for IP Integration
4.1.1 SW Test Qualification Methodology
Setting of IP Integration Verification
Consistency Analysis
Overall SW Qualification Methodology
Comparison to Classical Mutation Based Qualification
4.1.2 Consistency Demonstration Example
IP Block Basic Information
SW Tests
Coverage of SW Tests
Demonstration of Consistency Analysis
4.1.3 Experimental Results
Mutant Generation
Coverage Models
IRQMP
GPTimer
4.2 Data Flow Testing for Digital Virtual Prototypes
4.2.1 SystemC Running Example
4.2.2 Def–Use Association and Data Flow Testing
4.2.3 Data Flow Testing for SystemC
Overview
Classification of Data Flow Associations
Coverage Result
Illustration
4.2.4 Implementation Details
Static Analysis
Dynamic Analysis
4.2.5 Experimental Results
4.3 Data Flow Testing for SystemC AMS Virtual Prototypes
4.3.1 SystemC AMS Motivating Example
4.3.2 Data Flow Testing for SystemC-AMS TDF Models
Approach Overview
Classification of Data Flow Associations
Coverage Result and Test Adequacy Criteria
Illustration
4.3.3 Implementation Details
4.3.4 Experimental Results
Car Window Lifter System
Buck-Boost Converter
4.4 Summary
5 AMS Enhanced Functional Coverage Verification Environment
5.1 Preliminaries
5.1.1 Functional Coverage
5.1.2 AMS VP Verification Environment and Deficiencies
5.2 Enhanced Functional Coverage Verification Environment Setup
5.2.1 Running Example: LNA
5.2.2 Environment Setup
Input Stimuli Generation and Coverage
Stimuli Static Parameter Generation
Input Coverage Collection
Signal Generation
Output Coverage Definition and Collection
Cross-Coverage Definition
Checkers Definition
5.3 AMS Functional Coverage-Driven Verification Approach
5.3.1 Coverage Analysis
5.3.2 Industrial Case Study
5.4 Lightweight Coverage Directed Stimuli Generation
5.4.1 Revisiting Output Coverage Definition and Collection
5.4.2 Lightweight Coverage Analysis
Output Coverage Analyzer
Subtractor
Tuner
Capturing Unstable Behaviors
Illustration
5.4.3 Experimental Evaluation
LNA Models and Experimental Setup
Case Study: Taylor Series Approximation
Case Study: Fault-Injection and LCDG
5.5 Summary
6 Digital Early Security Validation
6.1 Static Information Flow Analysis
6.1.1 Approach Overview
Threat Model
Motivating Example
Overall Workflow
6.1.2 Data Flow Driven Information Flow Analysis
Information Extraction
Static Analysis
Information Flow Analysis
Illustration
Implementation Details
6.1.3 Experimental Results
CRYPTO AES IP
Near-Field Communication IP
Smart Card Reader IP
6.2 Dynamic Information Flow Analysis
6.2.1 Motivating Example and Threat Models
Threat Models
Motivating Example
6.2.2 Dynamic IFT Methodology
Overall Workflow
Tracking Transactions
Translating Transactions into Access Paths
Security Property Generation
Security Validation
6.2.3 Experimental Evaluation
Case Studies
6.3 Summary
7 Conclusion
7.1 Future Directions
Bibliography
Index
