Electrostatic discharge protection of semiconductor devices and integrated circuits : short-term static and dynamic loading conditions

Content: Introduction to Electrostatic Discharge ProtectionJuin J. LiouDesign of Component-Level On-Chip ESD Protection for Integrated CircuitsCharvaka DuvvuryESD and EOS: Failure Mechanisms and ReliabilityNathaniel Peachey and Kevin MelloESD, EOS, and Latch-Up Test Methods and Associated Reliability ConcernsAlan W. RighterDesign of Power-Rail ESD Clamp Circuits with Gate-Leakage Consideration in Nanoscale CMOS TechnologyMing-Dou Ker and Chih-Ting YehESD Protection in Automotive Integrated Circuit ApplicationsJavier A. Salcedo and Jean-Jacques HajjarESD Sensitivity of GaN-Based Electronic DevicesGaudenzio Meneghesso, Matteo Meneghini, and Enrico ZanoniESD Protection Circuits Using NMOS Parasitic Bipolar TransistorTeruo SuzukiESD Development in Foundry ProcessesJim VinsonCompact Modeling of Semiconductor Devices for Electrostatic Discharge Protection ApplicationsZhenghao Gan and Waisum WongAdvanced TCAD Methods for System-Level ESD DesignVladislav A. Vashchenko and Andrei A. ShibkovESD Protection of Failsafe and Voltage-Tolerant Signal PinsDavid L. Catlett, Jr., Roger A. Cline, and Ponnarith PokESD Design and Optimization in Advanced CMOS SOI TechnologyYou Li