A state-of-the-art review of modern families of digital instruments. For each family, the author covers internal design, use and applications, highlighting their advantages and limitations from a practical application viewpoint. New enabling semiconductor technology offers new capabilities to instrument designers and the text treats digital instrument families including data converters, signal processors and modern sensors. This title is an update of the author's earlier work, 'Modern Electronic Test and Measuring Instruments.'Also available: Adaptive Array Principles - ISBN 0863412475 Principles of Microwave Circuits - ISBN 0863411002The Institution of Engineering and Technology is one of the world's leading professional societies for the engineering and technology community. The IET publishes more than 100 new titles every year; a rich mix of books, journals and magazines with a back catalogue of more than 350 books in 18 different subject areas including: -Power & Energy -Renewable Energy -Radar, Sonar & Navigation -Electromagnetics -Electrical Measurement -History of Technology -Technology Management
Author(s): Nihal Kularatna
Year: 2002
Language: English
Pages: 645
Contents......Page 8
Foreword......Page 24
Preface......Page 26
Acknowledgements......Page 28
1.1 The basis of measurement......Page 32
1.2 International unit system......Page 33
1.4 Electrical standards......Page 37
1.5 Measurement errors......Page 41
1.7 References......Page 48
2.1 Introduction......Page 50
2.2 Integrated circuits progressing on to SoC......Page 51
2.3 Different categories of semiconductor components......Page 53
2.4 Processor based components and system components......Page 62
2.5 Semicustom and custom ICs......Page 73
2.6 Display devices......Page 79
2.7 Software......Page 81
2.8 Semiconductor sensors......Page 82
2.10 References......Page 83
3.2 Sampled data systems......Page 88
3.3 A-to-D converter errors......Page 98
3.4 Effects of sample-and-hold circuits......Page 102
3.5 SHA architectures......Page 110
3.6 ADC architectures......Page 112
3.7 D to A converters......Page 127
3.8 Data acquisition system interfaces......Page 137
3.9 References......Page 141
4.2 Waveform parameters and amplitude related measurements......Page 144
4.3 Digital multimeters......Page 157
4.4 High accuracy bench multimeters......Page 170
4.5 DMM specifications......Page 172
4.6 Multimeter safety......Page 175
4.7 Combination instruments – oscilloscope and DMM in a single package......Page 178
4.8 Pulse parameters and measurements......Page 179
4.9 References......Page 193
5.1 Introduction......Page 196
5.2 The cathode ray tube......Page 197
5.3 The basic operation of an oscilloscope......Page 201
5.4 Advanced techniques......Page 213
5.5 Digital storage oscilloscopes (DSOs)......Page 221
5.6 Probes and probing techniques......Page 233
5.7 References......Page 237
6.1 Introduction......Page 240
6.3 Analogue oscilloscopes: advantages and limitations......Page 241
6.4 Modern DSO design techniques......Page 244
6.5 Display update rate......Page 245
6.6 DSO solutions for capturing infrequent events......Page 250
6.7 Signal processing functions......Page 257
6.8 Practical DSO designs......Page 262
6.10 References......Page 274
7.2 Basic counter circuitry......Page 278
7.3 Modes of operation......Page 283
7.4 Accuracy of counters......Page 292
7.5 High frequency measurements and down conversion techniques......Page 305
7.6 Modulation domain analysers......Page 307
7.7 References......Page 311
8.1 Introduction......Page 312
8.2 Conventional signal sources......Page 313
8.3 Pulse and data generators......Page 315
8.4 Signal generators......Page 318
8.5 Microwave signal sources......Page 325
8.6 Arbitrary waveform generators (AWG)......Page 326
8.7 Different kinds of AWG......Page 337
8.9 Performance factors of AWGs......Page 344
8.10 References......Page 351
9.1 Introduction......Page 352
9.3 Continuous signals and Fourier analysis......Page 353
9.4 Discrete and digital signals......Page 355
9.5 Dynamic signal analysis......Page 358
9.6 Types of spectrum analyser......Page 368
9.7 Superheterodyne spectrum analyser......Page 370
9.8 Sweep control/use of video filters and display storage......Page 381
9.9 Use of a tracking generator with a spectrum analyser......Page 383
9.10 Alternative instruments for spectral analysis......Page 385
9.12 References......Page 386
10.1 Introduction......Page 388
10.2 Digital circuit testing and logic analysis......Page 389
10.3 Logic analyser fundamentals......Page 392
10.4 Types of analysis......Page 394
10.5 Probing......Page 402
10.6 Clocking......Page 403
10.7 Triggering......Page 406
10.8 Advanced features and measurement techniques......Page 408
10.9 Current logic analysers and related instruments......Page 411
10.10 Application examples of logic analysers......Page 418
10.11 References......Page 419
11.1 Introduction......Page 422
11.2 IEEE-488 bus......Page 423
11.3 VXIbus......Page 441
11.5 VLSI testing and automatic test equipment......Page 447
11.6 References......Page 451
12.1 Introduction......Page 454
12.2 Transmission line behaviour......Page 455
12.3 Decibel measurements......Page 457
12.4 Practical high frequency measurements......Page 460
12.5 RF insertion units for SWR and reflection coefficient measurements......Page 464
12.6 Field strength measurements......Page 465
12.7 Digital telecommunication transmission systems and associated measurements......Page 467
12.8 PCB designs and measurements at high frequencies......Page 501
12.9 References......Page 509
13.1 Introduction......Page 512
13.2 What is a DSP?......Page 513
13.3 Comparison between a microprocessor and a DSP......Page 514
13.4 Filtering applications and the evolution of DSP architecture......Page 517
13.5 Special addressing modes......Page 525
13.6 Important architectural elements in a DSP......Page 529
13.7 Instruction set......Page 539
13.8 Interface between DSPs and data converters......Page 544
13.9 A few simple examples of DSP applications......Page 548
13.10 Practical components and recent developments......Page 552
13.11 References......Page 553
14.1 Introduction......Page 556
14.2 The properties of silicon and their effects on sensors......Page 557
14.4 Temperature sensors......Page 558
14.5 Silicon pressure sensors......Page 585
14.6 Silicon accelerometers......Page 603
14.7 Hall effect devices......Page 612
14.8 Humidity and chemical sensors......Page 613
14.9 IEEE-P1451 Standard for smart sensors and actuators......Page 619
14.10 P1451 and practical components......Page 621
14.11 References......Page 623
15.2 Metrology and calibration......Page 626
15.3 Traceability......Page 627
15.4 Calibration of practical instruments in the field......Page 628
15.5 Calibration of oscilloscopes......Page 639
15.6 Calibrating high speed DSOs......Page 655
15.8 Multiproduct calibrators......Page 657
15.9 Automated calibration and calibration software......Page 658
15.10 Calibration intervals......Page 661
15.11 Conclusion......Page 662
15.12 References......Page 663
Index......Page 664
