This book presents the a scientific discussion of the state-of-the-art techniques and designs for modeling, testing and for the performance analysis of data converters. The focus is put on sustainable data conversion. Sustainability has become a public issue that industries and users can not ignore. Devising environmentally friendly solutions for data conversion designing, modeling and testing is nowadays a requirement that researchers and practitioners must consider in their activities. This book presents the outcome of the IWADC workshop 2011, held in Orvieto, Italy.
Author(s): Yu Lin, Athon Zanikopoulos, Kostas Doris, Hans Hegt, Arthur H. M. van Roermund (auth.), Paolo Carbone, Sayfe Kiaei, Fang Xu (eds.)
Series: Signals and Communication Technology
Edition: 1
Publisher: Springer-Verlag Berlin Heidelberg
Year: 2014
Language: English
Pages: 430
Tags: Signal, Image and Speech Processing; Circuits and Systems; Electronics and Microelectronics, Instrumentation
Front Matter....Pages i-ix
Front Matter....Pages 1-1
A Power-Optimized High-Speed and High-Resolution Pipeline ADC with a Parallel Sampling First Stage for Broadband Multi-Carrier Systems....Pages 3-28
Design of Power, Dynamic Range, Bandwidth and Noise Scalable ADCs....Pages 29-81
Current and Emerging Trends in the Design of Digital-to-Analog Converters....Pages 83-118
Digitally-Based Calibration Techniques for RF $$ \Upsigma \Updelta $$ Σ Δ Modulators....Pages 119-141
Incremental and Extended-Range Data Converters....Pages 143-159
Event-Driven Successive Charge Redistribution Schemes for Clockless Analog-to-Digital Conversion....Pages 161-209
Time-to-Digital Converters....Pages 211-246
Front Matter....Pages 247-247
Look-Up Tables, Dithering and Volterra Series for ADC Improvements....Pages 249-275
A/D Conversion with Non-uniform Differential Quantization....Pages 277-306
Front Matter....Pages 307-307
Dynamic Testing of Analog-to-Digital Converters by Means of the Sine-Fitting Algorithms....Pages 309-340
Histogram-Based Techniques for ADC Testing....Pages 341-377
DAC Standardization and Advanced Testing Methods....Pages 379-403
Uncertainty Analysis of Data Converters Testing Parameters....Pages 405-430
