Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

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Article. Published in International Journal Acta Materialia, 2016, V. 102, 212-219 pp.
In this work, cross-sectional structure-property relationships in a graded nanocrystalline 2 mm thick Ti1-xAlxN film were analyzed using in-situ bending tests on micro-cantilevers in transmission electron microscope, synchrotron X-ray nanodiffraction and nanoindentation. The results
document that sub-micron depth variations of fracture stresses, hardness and elastic moduli depend on phases, crystallite sizes, crystallographic texture, Ti/Al ratio and residual strain.

Author(s): Zalesak J., Bartosik M., Daniel R., e.a.

Language: English
Commentary: 1947785
Tags: Физика;Физика твердого тела;Физика поверхности и тонких пленок