Characterization of Wide Bandgap Power Semiconductor Devices

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At the heart of modern power electronics converters are power semiconductor switching devices. The emergence of wide bandgap (WBG) semiconductor devices, including silicon carbide and gallium nitride, promises power electronics converters with higher efficiency, smaller size, lighter weight, and lower cost than converters using the established siliconbased devices. However, WBG devices pose new challenges for converter design and require more careful characterization, in particular due to their fast switching speed and more stringent need for protection. Characterization of Wide Bandgap Power Semiconductor Devices presents comprehensive methods with examples for the characterization of this important class of power devices. After an introduction, the book covers pulsed static characterization; junction capacitance characterization; fundamentals of dynamic characterization; gate drive for dynamic characterization; layout design and parasitic management; protection design for double pulse test; measurement and data processing for dynamic characterization; cross-talk consideration; impact of three-phase system; and topology considerations.

Author(s): Fei (Fred) Wang, Zheyu Zhang, and Edward A. Jones
Series: IET Energy Engineering 128
Publisher: The Institution of Engineering and Technology
Year: 2018

Language: English
Pages: xiv+334

Chapter 1: IntroductionChapter 2: Pulsed static characterizationChapter 3: Junction capacitance characterizationChapter 4: Fundamentals of dynamic characterizationChapter 5: Gate drive for dynamic characterizationChapter 6: Layout design and parasitic managementChapter 7: Protection design for double pulse testChapter 8: Measurement and data processing for dynamic characterizationChapter 9: Cross-talk considerationChapter 10: Impact of three-phase systemChapter 11: Topology considerationAppendix A: Recommended equipment and components list for DPT setupAppendix B: Data processing code for dynamic characterization