InTech, 2012, 256 pages, ISBN: 9535104148 9789535104148This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields.ContentsPreface
Crystal Lattice Imaging Using Atomic Force Microscopy
Atomic Force Microscopy in Optical Imaging and Characterization
Magnetic Force Microscopy: Basic Principles and Applications
Vibration Responses of Atomic Force Microscope Cantilevers
Wavelet Transforms in Dynamic Atomic Force Spectroscopy
Nanoscale Effects of Friction, Adhesion and Electrical Conduction in AFM Experiments
Measurement of the Nanoscale Roughness by Atomic Force Microscopy: Basic Principles and Applications
Predicting Macroscale Effects Through Nanoscale Features
AFM Application in III-Nitride Materials and Devices
Atomic Force Microscopy to Characterize the Healing Potential of Asphaltic Materials
Atomic Force Microscopy - For Investigating Surface Treatment of Textile Fibers
