Atomic Force Microscopy for Energy Research

Cover
Half Title
Series Page
Title Page
Copyright Page
Table of Contents
Preface
Editor
Contributors
Chapter 1 Principles and Basic Modes of Atomic Force Microscopy
1.1 Working Principles of AFM
1.2 Contact Mode
1.3 Tapping Mode
1.4 PeakForce Tapping Mode
1.5 Force Measurement and Quantitative Nanoscale Mechanical Measurement
1.5.1 Force-Distance Curve
1.5.2 PeakForce Quantitative Nanoscale Mechanical Method
1.6 High-Resolution Imaging of AFM
1.6.1 Vertical Resolution
1.6.2 Lateral Resolution
1.6.3 Atomic and Sub-nanometer Resolution
1.7 Imaging in Air, Liquid, UHV
1.8 AFM for Electrical Conductivity Imaging
References
Chapter 2 Advanced Modes of Electrostatic and Kelvin Probe Force Microscopy for Energy Applications
2.1 Introduction
2.2 Electrostatic Force Microscopy
2.2.1 Principles of EFM
2.2.2 EFM Scanning Modes
2.2.3 Quantitative EFM
2.3 Kelvin Probe Force Microscopy
2.3.1 Contact Potential Difference and the Kelvin Method
2.3.2 Kelvin Probe Force Microscopy
2.3.3 Amplitude and Frequency Modulation
2.3.4 Tip Calibration and Environmental Considerations
2.3.5 Feedback Artifacts
2.4 EFM/KPFM Applications for Energy Research
2.5 Advanced Modes of EFM/KPFM Operation
2.5.1 Open-Loop Modes of KPFM Operation
2.5.2 Multifrequency and Multidimensional KPFM
2.5.3 Three-Dimensional EFM/KPFM
2.5.4 Contact and Pulsed Force Techniques
2.5.4.1 Contact Mode Electrostatic Force Microscopy
2.5.4.2 Contact Kelvin Probe Force Microscopy
2.5.4.3 Pulsed Force KPFM
2.5.5 Time-Resolved EFM/KPFM Methods
2.6 Applications at the Solid-Liquid Interface
2.6.1 Measuring Electrostatic Forces with SPM at the
Solid-Liquid Interface
2.6.2 Applications of EFM in Liquid
2.6.3 Applications of KPFM in Liquid
2.7 Conclusions and Future Perspective
Acknowledgments
References
Chapter 3 Piezoresponse Force Microscopy and Electrochemical Strain Microscopy
3.1 Principle of PFM and ESM
3.1.1 Vertical-PFM and ESM
3.1.2 Lateral-PFM and Vector-PFM
3.1.3 PFM and ESM Spectroscopy
3.2 Functions of PFM and ESM
3.2.1 Electric Field-Strain Coupling Detection
3.2.2 Surface Domain Characterization and Manipulation
3.2.3 Voltage Spectroscopy Measurement
3.3 Challenges in PFM and ESM
3.3.1 Contact-Mode Operation
3.3.2 Electrostatic Force Effect
3.3.3 Multi-Signal Sources
3.3.4 Spatial Resolution
3.3.5 Quantification
3.4 Advances in PFM and ESM
3.4.1 Contact Resonance PFM/ESM
3.4.2 Resonance Tracking PFM/ESM
3.4.3 Metrological PFM/ESM
3.4.4 Dynamic Contact PFM/ESM
3.4.5 Heterodyne Megasonic Piezoresponse Force Microscopy
3.4.6 Non-Contact Heterodyne Electrostrain Force Microscopy
3.5 Summary
References
Chapter 4 Hybrid AFM Technique: Atomic Force Microscopy-Scanning Electrochemical Microscopy
4.1 Introduction
4.2 Atomic Force Microscopy-Scanning Electrochemical Microscopy (AFM-SECM)
4.2.1 The Principles of AFM-SECM
4.2.1.1 SECM
4.2.1.2 AFM
4.2.1.3 AFM-SECM
4.2.2 AFM-SECM Probe
4.2.3 AFM-SECM Working Modes
4.3 Application Areas of AFM-SECM
4.3.1 Application in Electrocatalysis
4.3.2 Application in Corrosion Research
4.3.2 Application in Life Science
4.4 Perspective
References
Chapter 5 Scanning Microwave Impedance Microscopy
5.1 Introduction
5.2 sMIM Working Principle
5.2.1 sMIM Probe
5.2.2 Probe Interface Module
5.2.3 Microwave Electronics
5.2.4 Scanning Platform
5.2.5 sMIM Image Mechanism
5.2.6 sMIM Operational Modes
5.2.6.1 Direct sMIM
5.2.6.2 Lift Mode
5.2.6.3 sMIM C-V Curve with DC Bias Sweep
5.2.6.4 sMIM dC/dV with AC Bias Modulation
5.3 sMIM Features
5.3.1 Sub-aF Electrical Resolution
5.3.2 Nano-Meter Spatial Resolution
5.3.3 Linear Response to Dielectric Constant
5.3.4 Linear Response to Doping Concentration
5.3.5 Subsurface Sensing
5.4 sMIM Applications at Room Temperature
5.4.1 Semiconductors
5.4.2 Subsurface Sensing
5.4.3 2D Materials
5.4.4 Ferroelectrics
5.4.5 C-V Curve
5.5 sMIM at Low Temperature
5.5.1 Quantum Effect
5.6 Summary
Bibliography
Chapter 6 Atomic Force Microscopy-Based Infrared Microscopy for Chemical Nano-Imaging and Spectroscopy
6.1 Photothermal AFM-IR Microscopy
6.2 Application of AFM-IR in Energetic Materials
6.3 Scattering-Type Scanning Near-Field Optical Microscopy
6.4 Applications of s-SNOM in Energy Materials
6.5 Summary and Comparison between AFM-IR and IR s-SNOM
References
Chapter 7 Application of AFM in Lithium Batteries Research
7.1 Introduction
7.2 In Situ Visualization of On-site Formation of CEI and SEI in Lithium-ion Batteries
7.2.1 Introduction: Interfacial Electrochemistry in Li-ion Batteries
7.2.2 In situ AFM Imaging of the Evolution of the CEI Film
7.2.3 SEI Live Formation at the Anode/Electrolyte Interfaces in Classical Liquid Electrolytes
7.2.4 Regulation Strategies for SEI Films
7.3 Interfacial Evolution in Lithium-Sulfur Batteries
7.3.1 Lithium-Sulfur Batteries: Introduction and Interfacial Electrochemistry
7.3.2 Dynamic Evolution at the Cathode/Electrolyte Interfaces in Lithium-Sulfur Batteries
7.4 Correlating the Catalytic Effect and Interfacial Reactions in Lithium-Oxygen Batteries
7.4.1 Interfacial Electrochemistry in Lithium-Oxygen Batteries
7.4.2 In Situ AFM Observation of the Electrolyte Effect
7.4.3 In Situ AFM Monitoring the Catalytic Effect of Solid Catalysts
7.4.4 In Situ AFM Visualization of the Surface Effect of Soluble Catalysts
7.5 SEI Evolution and Li Plating/Stripping Processes on Li Metal Anode
7.5.1 Introduction
7.5.2 The SEI Film at Lithium Metal Anode/Electrolyte Interface
7.5.3 Dynamic Evolution and Artificial Regulation of Li
Precipitation Behaviors
7.6 Dynamic Evolution of the Electrode Processes and Solid Electrolytes in Solid-State Lithium Batteries
7.6.1 Introduction
7.6.2 Cathode Electrolyte Interphase Evolution
7.6.3 Structural Deformation and Ion Migration Mechanism
of Solid Electrolyte
7.6.4 Microscopic Mechanism of the Alloying-Regulated
Lithium Precipitation
7.6.5 Growth Behavior and Interphasial Property of Lithium Dendrites
7.7 Summary and Outlook
References
Chapter 8 Application of AFM in Solar Cell Research
8.1 Introduction
8.2 Monocrystalline and Polycrystalline Silicon Solar Cells
8.3 Amorphous and Polycrystalline Silicon Thin-Film Solar Cells
8.3.1 Amorphous Silicon Thin-Film (a-Si) Solar Cells
8.3.2 CdTe Thin-Film Solar Cells
8.3.3 CIGS Solar Cells
8.4 Third-Generation Solar Cell
8.4.1 Organic Solar Cells
8.4.2 Dye-Sensitized Solar Cells
8.4.3 Perovskite Solar Cells
8.5 Outlook
References
Chapter 9 Application of AFM for Analyzing the Microstructure of Ferroelectric Polymer as an Energy Material
9.1 Introduction
9.2 Current Challenge
9.2.1 Crystallographic Structure of PVDF and P(VDF-TrFE)
9.2.2 Current Challenge in Polar Phase PVDF Fabrication and Phase Content Adjustment
9.2.3 AFM-Based Characterization Techniques for Fluoropolymer
9.3 Application of PFM for Piezoelectric Polymer
9.3.1 Combined PFM and KFM Study of the Surface Charge Dynamics in Tribological Nanogenerators
9.3.2 Vector PFM Characterization of P (VDF-TrFE) Nanowires
9.3.3 In Situ Hot Stage PFM
9.4 AFM-IR Techniques for Ferroelectric Materials Study
9.4.1 Application for Copolymer Films in Low Energy Consumption Ferroelectric Memory
9.4.2 Application in Investigating Ferroelectric Polymer Films for Energy Harvester
9.5 Other New Applications
9.6 Further Development and Outlook
References
Chapter 10 Application of AFM in Microbial Energy Systems
10.1 Introduction
10.2 Morphology Characterization
10.2.1 Microbial Morphologies
10.2.1.1 Size and Morphology of Single Cell
10.2.1.2 Extracellular Appendages and Vesicles
10.2.2 Catalysts and Electrode Materials
10.3 Mechanical Properties
10.4 Electron Transfer Mechanisms
10.4.1 Electrical Conductivity
10.4.1.1 Microbial Cells and Nanowires
10.4.1.2 Inorganic-Microbial Materials
10.4.2 Electrochemical Redox Activity
10.4.2.1 Microenvironment of the Biofilm
10.4.2.2 Bioelectrochemistry at the Nanoscale
10.5 Summary and Future Prospects
References
Chapter 11 Practical Guidance of AFM Operations for Energy Research
11.1 Introduction
11.2 AFM Sample Preparation
11.2.1 Common Rules for AFM Sample Preparation
11.2.2 Sample Preparation for Different Applications
11.2.2.1 Force Measurement
11.2.2.2 Electrical Measurement
11.2.2.3 AFM-IR
11.2.2.4 Electrochemistry
11.3 AFM Probe Selection
11.3.1 Key Parameters of AFM Probes
11.3.2 Optimal Probes for Specified Applications
11.3.2.1 Fast Imaging
11.3.2.2 Low Drift Fluid Imaging
11.3.2.3 Force Measurement
11.3.2.4 Electrical Measurement
11.3.2.5 AFM-IR
11.4 AFM Artifacts Recognition
11.4.1 Common Artifacts in Topography Imaging
11.4.2 Artifacts in Force Measurement
11.4.3 Artifacts in Electrical Measurement
11.5 AFM Data Processing
11.5.1 Remove Z Offset, Tilt, and Bow
11.5.2 Remove Noise
11.6 Summary
References
Index