Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.
Author(s): Peter Eaton, Paul West
Publisher: Oxford University Press, USA
Year: 2010
Language: English
Pages: 257
Tags: Физика;Практикумы, экспериментальная физика и физические методы исследования;
Contents......Page 6
Preface......Page 8
1 Introduction......Page 10
1.1 Background to AFM......Page 11
1.2 AFM today......Page 15
2.1 Basic concepts in AFM instrumentation......Page 18
2.2 The AFM stage......Page 22
2.3 AFM electronics......Page 36
2.4 Acquisition software......Page 42
2.5 AFM cantilevers and probes......Page 45
2.6 AFM instrument environment......Page 54
2.7 Scanning environment......Page 55
3.1 Topographic modes......Page 58
3.2 Non-topographic modes......Page 73
3.3 Surface modification......Page 87
4.1 Sample preparation for AFM......Page 91
4.2 Measuring AFM images in contact mode......Page 96
4.3 Measuring AFM images in oscillating modes......Page 105
4.4 High-resolution imaging......Page 109
4.5 Force curves......Page 110
5 AFM image processing and analysis......Page 112
5.1 Processing AFM images......Page 113
5.2 Displaying AFM images......Page 119
5.3 Analysing AFM images......Page 123
6.1 Probe artefacts......Page 130
6.2 Scanner artefacts......Page 135
6.3 Image processing artefacts......Page 140
6.5 Noise from other sources......Page 142
6.6 Other artefacts......Page 144
7.1 AFM applications in physical and materials sciences......Page 148
7.2 AFM applications in nanotechnology......Page 160
7.3 Biological applications of AFM......Page 169
7.4 Industrial AFM applications......Page 186
Appendix A: AFM standards......Page 193
Appendix B: Scanner calibration and certification procedures......Page 201
Appendix C: Third party AFM software......Page 207
Bibliography......Page 210
C......Page 250
F......Page 251
L......Page 252
N......Page 253
P......Page 254
S......Page 255
W......Page 256
Z......Page 257
