Advanced Computing in Electron Microscopy, 2nd Edition, brings together diverse information on image simulation. An invaluable resource, this book provides information on various methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. This text will serve as a great tool for students at the advanced undergraduate or graduate level, as well as experienced researchers in the field.
This enhanced second edition includes:
-descriptions of new developments in the field
-updated references
-additional material on aberration corrected instruments and confocal electron microscopy
-expanded and improved examples and sections to provide stronger clarity
Author(s): Earl J. Kirkland (auth.)
Edition: 2
Publisher: Springer US
Year: 2010
Language: English
Pages: 289
Tags: Characterization and Evaluation of Materials; Electrical Engineering
Front Matter....Pages i-x
Introduction....Pages 1-4
The Transmission Electron Microscope....Pages 5-27
Linear Image Approximations....Pages 29-60
Sampling and the Fast Fourier Transform....Pages 61-76
Calculation of Images of Thin Specimens....Pages 77-113
Theory of Calculation of Images of Thick Specimens....Pages 115-161
Multislice Applications and Examples....Pages 163-197
The Programs....Pages 199-231
Plotting Transfer Functions....Pages 233-240
The Fourier Projection Theorem....Pages 241-242
Atomic Potentials and Scattering Factors....Pages 243-260
Bilinear Interpolation....Pages 261-263
3D Perspective View....Pages 265-269
Back Matter....Pages 287-289
