Опорный конспект по кристаллографии и методам дифракции.
2004 г. 105 стр.
Основные понятия кристаллографии
Явление дифракции в кристаллах как основа метода структурного анализа
Основные методы рентгеноструктурного анализа
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Author(s): Морозова Н.К.
Language: Russian
Commentary: 629308
Tags: Горно-геологическая отрасль;Минералогия и кристаллография