'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]UltramicroscopyThis unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
Author(s): Hiroyasu Saka
Publisher: World Scientific Publishing
Year: 2021
Language: English
Pages: 308
City: Singapore
Contents
Preface
About the Author
Acknowledgments
Chapter 1. The Fundamentals of Crystallography
1.1 Crystal Structure and Space Lattice
1.2 Miller Indices
1.3 Hexagonal Indices
1.4 Typical Crystal Structures
Chapter 2. Stereographic Projection and the Reciprocal Lattice
2.1 Space Projection
2.2 Application of Stereographic Projection
2.3 Reciprocal Lattice
Chapter 3. Crystal Dislocations
3.1 Definition of Dislocation
3.2 Burgers Vector
3.3 Displacement Around a Dislocation
3.4 Dissociated Dislocations in FCC
3.5 Super-Dislocations in Ordered Alloys and Intermetallic Compounds
Chapter 4. Diffraction of Electrons by a Crystal
4.1 Plane Wave
4.2 Scattering by a Single Atom
4.3 Scattering by a Unit Cell: Diffraction
4.4 The Ewald Sphere
4.5 Structure Factor
4.6 Broadening of Reciprocal Lattice Points Due to the Outer Shape of a Crystal
Chapter 5. Electron Microscope
5.1 Basic Design of the Electron Microscope
5.2 Electron Diffraction and Electron Microscope
5.3 Electron Diffraction Pattern and its Indexing
5.4 Kikuchi Pattern
5.5 Analyzing Diffraction Pattern from a Specimen Containing Two Crystals: Analysis of Orientation Relationship
5.6 Indexing Laue Zones
Chapter 6. TEM Image of a Perfect Crystal
6.1 Diffraction Contrast and Bright-Field and Dark-Field Images
6.2 Selected Area Diffraction (SAD)
6.3 Thickness Contour and Bend Contour
6.4 Dynamical Theory of Diffraction
6.5 CAT Method to Estimate Sharpness of an Interface in an Artificial Super-Lattice
6.6 Supplement
Chapter 7. Contrast of Planar Defects and Precipitates
7.1 General Theory
7.2 Planar Defects
7.3 Precipitates
7.4 Moire Fringes
7.5 Summary of Contrasts from Planar Defects
7.6 Supplement
Chapter 8. Contrasts of Dislocations
8.1 Determining Burgers Vector of Dislocations
8.2 Determining the Sign of Burgers Vector
8.3 Determining Natures of Dislocation Loop
8.4 Miscellaneous Contrasts
8.5 Supplement
Chapter 9. Dark Field Weak-Beam Method, Stereographic Analysis
9.1 Dark Field Weak-Beam Method
9.2 Stereographic Observation
9.3 Trace Analysis
9.4 Effects of Surface
Chapter 10. Diffraction Contrast in STEM
10.1 General Theory
10.2 Diffraction Contrast in STEM
10.3 Resolution of Dislocations Observed by Diffraction Contrast in STEM
10.4 HAADF
Chapter 11. CBED and LACBED
11.1 Introduction
11.2 Determining Nature of a Dislocation by LACBED
11.3 Advantages and Drawbacks of Different Methods to Determine Absolute Values of Burgers Vectors
Appendices
Appendix A
Appendix B
Appendix C
Appendix D
Appendix E
Appendix F
Appendix G
Appendix H
Appendix I
Appendix J
Appendix K
Appendix L: Determining Orientation of Single Crystal by Back-Scattered Laue Method
Bibliography
Index
