Material Characterization Using Electron Holography

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Material Characterization using Electron Holography

Exploration of a unique technique that offers exciting possibilities to analyze electromagnetic behavior of materials

Material Characterization using Electron Holography addresses how the electromagnetic field can be directly visualized and precisely interpreted based on Maxwell’s equations formulated by special relativity, leading to the understanding of electromagnetic properties of advanced materials and devices. In doing so, it delivers a unique route to imaging materials in higher resolution.

The focus of the book is on in situ observation of electromagnetic fields of diverse functional materials. Furthermore, an extension of electron holographic techniques, such as direct observation of accumulation and collective motions of electrons around the charged insulators, is also explained. This approach enables the reader to develop a deeper understanding of functionalities of advanced materials.

Written by two highly qualified authors with extensive first-hand experience in the field, Material Characterization using Electron Holography covers topics such as:

  • Importance of electromagnetic fields and their visualization, Maxwell’s equations formulated by special relativity, and de Broglie waves and wave functions
  • Outlines of general relativity and Einstein’s equations, principles of electron holography, and related techniques
  • Simulation of holograms and visualized electromagnetic fields, electric field analysis, and in situ observation of electric fields
  • Interaction between electrons and charged specimen surfaces and interpretation of visualization of collective motions of electrons

For materials scientists, analytical chemists, structural chemists, analytical research institutes, applied physicists, physicists, semiconductor physicists, and libraries looking to be on the cutting edge of methods to analyze electromagnetic behavior of materials, Material Characterization using Electron Holography offers comprehensive coverage of the subject from authoritative and forward-thinking topical experts.

Author(s): Takeshi Tomita, Daisuke Shindo
Publisher: Wiley-VCH
Year: 2022

Language: English
Pages: 241
City: Weinheim

Cover
Title Page
Copyright
Contents
Preface
List of Specimens
Part I Introduction
Chapter 1 Importance of Electromagnetic Field and Its Visualization
Chapter 2 Maxwell's Equations and Special Relativity
2.1 Maxwell's Equations and Electromagnetic Potentials
2.2 Maxwell's Equations Formulated Using Special Relativity
References
Chapter 3 Basis of Transmission Electron Microscopy
Part II Principles and Practice
Chapter 4 Principles of Electron Holography
4.1 Types of Electron Holography
4.2 Outline of Electron Holography
4.3 Comparison of Phase Shifts Due to Scalar and Vector Potentials
4.3.1 Phase Shift Due to Scalar Potential
4.3.2 Phase Shift Due to Vector Potential
4.3.3 Effect of Thickness Change on Phase Shifts Due to Scalar and Vector Potentials
4.3.4 Electric Information
4.4 Analysis of Reconstructed Phase Images by Computer Simulation
References
Chapter 5 Microscope Constitution and Hologram Formation
5.1 Basic Constitution of Transmission Electron Microscope
5.1.1 Electron Gun System
5.1.2 Illumination System
5.1.3 Imaging System
5.1.3.1 Focal Length
5.1.3.2 Spherical Aberration Coefficient
5.1.3.3 Chromatic Aberration Coefficient
5.1.3.4 Minimum Step of Defocus
5.1.4 Observation System
5.1.4.1 Television Camera
5.1.4.2 Slow‐Scan Charge‐Coupled Device Camera
5.1.5 Operation of Transmission Electron Microscope
5.1.5.1 Adjustment of Electron Gun
5.1.5.2 Alignment and Astigmatism Correction of Condenser Lenses
5.1.5.3 Alignment of Voltage Center and Correction of Objective Lens Astigmatism
5.1.5.4 Correction of Intermediate Lens Astigmatism
5.1.5.5 Alignment of Projector Lens
5.1.5.6 Adjustment of Objective Lens Focus
5.2 Biprism System
5.3 Coherence Lengths
5.4 Formation of Interference Fringes
5.4.1 Geometrical‐Path Interpretation with Two Virtual Sources
5.4.2 Wave‐Optical Treatment
5.4.2.1 Wave Function at Wire Plane
5.4.2.2 Green's Integral Theorem
5.4.2.3 Explicit Form of Green's Function
5.4.2.4 Intensity Distribution of Interference Fringes
5.4.2.5 Stationary Points and Interference Region
5.4.2.6 Spacing of Interference Fringes
5.5 Simulation of Interference Fringes
References
Chapter 6 Related Techniques and Specialized Instrumentation
6.1 Split‐Illumination Electron Holography
6.2 Dark‐Field Electron Holographic Interferometry
6.3 Lorentz Microscopy
6.3.1 Fresnel Mode (Defocusing Mode)
6.3.2 Foucault Mode (In‐Focus Mode)
6.3.3 Lorentz Microscopy Using Scanning Transmission Electron Microscope
6.3.4 Phase Reconstruction Using Transport‐of‐Intensity Equation
6.4 Magnetically Shielded Lens and High‐Voltage Electron Microscope
6.5 Aberration‐Corrected Lens System
6.6 Multifunctional Specimen Holders with Piezodriving Probes
6.7 Specimen Preparation Techniques
6.8 High‐Resolution and Analytical Electron Microscopy
6.8.1 Conventional Microscopy and High‐Resolution Electron Microscopy
6.8.2 High‐Angle Annular Dark‐Field Method
6.8.3 Analytical Electron Microscopy
References
Part III Application
Chapter 7 Electric Field Analysis
7.1 Measurement of Inner Potential
7.1.1 Diamond‐Like Carbon
7.1.2 SiO2 Particles
7.1.3 p–n Junctions and Low‐Dimensional Materials
7.2 Electric Field Analysis of Precipitates in Multilayer Ceramic Capacitor
7.3 Analysis of Spontaneous Polarization in Oxide Heterojunctions
7.4 Evaluation of Electric Charge with Laser Irradiation
7.5 Analysis of Conductivity with Microstructure Changes
7.6 Detection of Electric Field Variation Around Field Emitter
References
Chapter 8 Magnetic Field Analysis
8.1 Quantitative Analysis of Magnetic Flux Distribution of Nanoparticles
8.2 Observation of Magnetization Processes
8.2.1 Soft Magnetic Materials
8.2.2 Hard Magnetic Materials
8.2.3 Magnetic Recording Materials
8.2.4 Ferromagnetic Shape‐Memory Materials
8.3 Observation of Magnetic Structure Change with Temperature
8.4 Analysis of Three‐Dimensional Magnetic Structures
References
Part IV Visualization of Collective Motions of Electrons and Their Interpretation
Chapter 9 Charging Effects and Secondary Electron Distribution of Biological Specimens
9.1 Visualization of Stationary Electron Orbits
9.1.1 Stationary Electron Orbits Observed Around Microfibrils
9.1.2 Simulation of Electron Orbits Around Microfibril
9.1.3 Interpretation of Reconstructed Amplitude Image
9.1.4 Simulation of Visibility of Interference Fringes for Electron Motion
9.1.5 Change in Electron Orbits Due to Insertion of Electrode
9.2 Visualization of Accumulative and Collective Motions of Electrons
References
Chapter 10 Collective Motions of Electrons Around Various Charged Insulators
10.1 Accumulation of Electrons on Cleaved Surfaces of BaTiO3
10.2 Dependency of Electron Distribution on Surface Condition of Epoxy Resin and Kidney
10.3 Electron Distribution Between Epoxy Resin and Kidney
10.4 Control of Electron Distribution Around Cellulose Nanofibers by Applying External Electric Field
References
Chapter 11 Extension of Analysis of Collective Motions of Electrons
11.1 Electron Spin Polarization
11.2 Accumulation of Electrons on Bulk Insulator Surface
References
Chapter 12 Theoretical Consideration on Visualizing Collective Motions of Electrons
12.1 De Broglie's Matter Wave and Wave Function
12.2 Disturbance‐Free Observation
12.3 Electron Interference and General Relativity
12.3.1 Einstein's Field Equations Based on General Relativity
12.3.2 Infeld and Schild's Approximate Solution to Einstein's Field Equations
12.4 Spinning Linear Wave Model
12.5 Electron Interference Formulated with Spinning Linear Wave
12.5.1 Interpretation of Diffraction Intensity
12.5.2 Interpretation of Interference Fringes
12.5.3 Simulation of Interference Fringes
12.6 Interpretation of Wave–Particle Dualism
References
A Physical Constants, Conversion Factors, and Electron Wavelength
Index
EULA